Showing 1 - 20 results of 33 for search 'El-Maleh, Aiman', query time: 0.02s Refine Results
  1. 1
    Interconnect-Efficient LDPC Code Design

    Interconnect-Efficient LDPC Code Design by El-Maleh, Aiman

    Published 2006
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  2. 2
    AN EFFICIENT TEST RELAXATION TECHNIQUE FOR COMBINATIONAL LOGIC CIRCUITS

    AN EFFICIENT TEST RELAXATION TECHNIQUE FOR COMBINATIONAL LOGIC CIRCUITS by El-Maleh, Aiman

    Published 2020
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  3. 3
    Efficient static compaction techniques for sequential circuits based on reverse-order restoration and test relaxation

    Efficient static compaction techniques for sequential circuits based on reverse-order restoration and test relaxation by El-Maleh, Aiman H.

    Published 2006
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  4. 4
    A Hybrid Test Compression Technique for Efficient Testing of Systems-on-a-Chip

    A Hybrid Test Compression Technique for Efficient Testing of Systems-on-a-Chip by El-Maleh, Aiman H.

    Published 2003
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  5. 5
    Evolutionary algorithms for state justification in sequential automatic test pattern generation

    Evolutionary algorithms for state justification in sequential automatic test pattern generation by El-Maleh, Aiman H.

    Published 2005
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  6. 6
    A Class-based Clustering Static Compaction Technique for Combinational Circuits

    A Class-based Clustering Static Compaction Technique for Combinational Circuits by El-Maleh, Aiman H.

    Published 2004
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  7. 7
    A Geometric-Primitives-Based Compression Scheme for Testing Systems-on-a-Chip

    A Geometric-Primitives-Based Compression Scheme for Testing Systems-on-a-Chip by El-Maleh, Aiman H.

    Published 2001
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  8. 8
    On Test Vector Reordering for Combinational Circuits

    On Test Vector Reordering for Combinational Circuits by El-Maleh, Aiman H.

    Published 2004
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  9. 9
    ON IMPROVING THE EFFECTIVENESS OF SYSTEM-ON-ACHIP TEST DATA COMPRESSION BASED ON EXTENDED FREQUENCY DIRECTED RUN-LENGTH CODES

    ON IMPROVING THE EFFECTIVENESS OF SYSTEM-ON-ACHIP TEST DATA COMPRESSION BASED ON EXTENDED FREQUENCY DIRECTED RUN-LENGTH CODES by El-Maleh, Aiman H.

    Published 2020
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  10. 10
    An Efficient Test Relaxation Technique for Synchronous Sequential Circuits

    An Efficient Test Relaxation Technique for Synchronous Sequential Circuits by El-Maleh, Aiman H.

    Published 2004
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  11. 11
    Efficient Test Compaction for Combinational Circuits Based on Fault Detection Count-Directed Clustering

    Efficient Test Compaction for Combinational Circuits Based on Fault Detection Count-Directed Clustering by El-Maleh, Aiman H.

    Published 2006
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  12. 12
    An Efficient Test Vector Compression Technique Based on Block Merging

    An Efficient Test Vector Compression Technique Based on Block Merging by El-Maleh, Aiman H.

    Published 2006
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  13. 13
    Extended Frequency-Directed Run-Length Code with Improved Application to System-on-a-Chip Test Data Compression

    Extended Frequency-Directed Run-Length Code with Improved Application to System-on-a-Chip Test Data Compression by El-Maleh, Aiman H.

    Published 2002
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  14. 14
    An Efficient Test Relaxation Technique for Combinational Circuits Based on Critical Path Tracing

    An Efficient Test Relaxation Technique for Combinational Circuits Based on Critical Path Tracing by El-Maleh, Aiman H.

    Published 2002
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  15. 15
    ON EFFICIENT EXTRACTION OF PARTIALLY SPECIFIED TEST SETS FOR SYNCHRONOUS SEQUENTIAL CIRCUITS

    ON EFFICIENT EXTRACTION OF PARTIALLY SPECIFIED TEST SETS FOR SYNCHRONOUS SEQUENTIAL CIRCUITS by El-Maleh, Aiman H.

    Published 2003
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  16. 16
    A Reconfigurable Broadcast Scan Compression Scheme Using Relaxation Based Test Vector Decomposition

    A Reconfigurable Broadcast Scan Compression Scheme Using Relaxation Based Test Vector Decomposition by El-Maleh, Aiman H.

    Published 2007
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  17. 17
    An Iterative Heuristic for State Justi�cation in Sequential Automatic Test Pattern Generation

    An Iterative Heuristic for State Justi�cation in Sequential Automatic Test Pattern Generation by El-Maleh, Aiman H.

    Published 2001
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  18. 18
    Efficient Test Compaction for Combinational Circuits Based on Fault Detection Count-Directed Clustering

    Efficient Test Compaction for Combinational Circuits Based on Fault Detection Count-Directed Clustering by El-Maleh, Aiman H.

    Published 2007
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  19. 19
    An Evolutionary Meta-Heuristic for State Justification in Sequential Automatic Test Pattern Generation

    An Evolutionary Meta-Heuristic for State Justification in Sequential Automatic Test Pattern Generation by El-Maleh, Aiman H.

    Published 2001
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  20. 20
    A Fast Sequential Learning Technique for Real Circuits with Application to Enhancing ATPG Performance

    A Fast Sequential Learning Technique for Real Circuits with Application to Enhancing ATPG Performance by El-Maleh, Aiman H.

    Published 1998
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