Interconnect-Efficient LDPC Code Design حسب El-Maleh, Aiman

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AN EFFICIENT TEST RELAXATION TECHNIQUE FOR COMBINATIONAL LOGIC CIRCUITS حسب El-Maleh, Aiman

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Efficient static compaction techniques for sequential circuits based on reverse-order restoration and test relaxation حسب El-Maleh, Aiman H.

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A Hybrid Test Compression Technique for Efficient Testing of Systems-on-a-Chip حسب El-Maleh, Aiman H.

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Evolutionary algorithms for state justification in sequential automatic test pattern generation حسب El-Maleh, Aiman H.

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A Class-based Clustering Static Compaction Technique for Combinational Circuits حسب El-Maleh, Aiman H.

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A Geometric-Primitives-Based Compression Scheme for Testing Systems-on-a-Chip حسب El-Maleh, Aiman H.

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On Test Vector Reordering for Combinational Circuits حسب El-Maleh, Aiman H.

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ON IMPROVING THE EFFECTIVENESS OF SYSTEM-ON-ACHIP TEST DATA COMPRESSION BASED ON EXTENDED FREQUENCY DIRECTED RUN-LENGTH CODES حسب El-Maleh, Aiman H.

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An Efficient Test Relaxation Technique for Synchronous Sequential Circuits حسب El-Maleh, Aiman H.

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Efficient Test Compaction for Combinational Circuits Based on Fault Detection Count-Directed Clustering حسب El-Maleh, Aiman H.

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An Efficient Test Vector Compression Technique Based on Block Merging حسب El-Maleh, Aiman H.

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Extended Frequency-Directed Run-Length Code with Improved Application to System-on-a-Chip Test Data Compression حسب El-Maleh, Aiman H.

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An Efficient Test Relaxation Technique for Combinational Circuits Based on Critical Path Tracing حسب El-Maleh, Aiman H.

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ON EFFICIENT EXTRACTION OF PARTIALLY SPECIFIED TEST SETS FOR SYNCHRONOUS SEQUENTIAL CIRCUITS حسب El-Maleh, Aiman H.

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A Reconfigurable Broadcast Scan Compression Scheme Using Relaxation Based Test Vector Decomposition حسب El-Maleh, Aiman H.

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An Iterative Heuristic for State Justi�cation in Sequential Automatic Test Pattern Generation حسب El-Maleh, Aiman H.

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Efficient Test Compaction for Combinational Circuits Based on Fault Detection Count-Directed Clustering حسب El-Maleh, Aiman H.

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An Evolutionary Meta-Heuristic for State Justification in Sequential Automatic Test Pattern Generation حسب El-Maleh, Aiman H.

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A Fast Sequential Learning Technique for Real Circuits with Application to Enhancing ATPG Performance حسب El-Maleh, Aiman H.

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