Showing 1 - 3 results of 3 for search 'Osais, Y.E.', query time: 0.01s Refine Results
  1. 1
    A static test compaction technique for combinational circuits based on independent fault clustering

    A static test compaction technique for combinational circuits based on independent fault clustering by Osais, Y.E.

    Published 2003
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  2. 2
    A class-based clustering static compaction technique for combinational circuits

    A class-based clustering static compaction technique for combinational circuits by El-Maleh, A.H.

    Published 2004
    Other Authors: “…Osais, Y.E.…”
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  3. 3
    On test vector reordering for combinational circuits

    On test vector reordering for combinational circuits by El-Maleh, A.H.

    Published 2004
    Other Authors: “…Osais, Y.E.…”
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