Showing 1 - 3 results of 3 for search 'Osman, M.', query time: 0.01s Refine Results
  1. 1
    Fault characterization and testability considerations inmulti-valued logic circuits

    Fault characterization and testability considerations inmulti-valued logic circuits by Abd-El-Barr, Mostafa

    Published 1999
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  2. 2
    New fault models and efficient BIST algorithms for dual-portmemories

    New fault models and efficient BIST algorithms for dual-portmemories by Amin, A.A.

    Published 1997
    Other Authors: “…Osman, M.Y.…”
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  3. 3
    Efficient O(n) BIST algorithms for DDNPS faults in dual portmemories

    Efficient O(n) BIST algorithms for DDNPS faults in dual portmemories by Amin, A.A.

    Published 2020
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