A Hybrid Test Compression Technique for Efficient Testing of Systems-on-a-Chip

One of the major challenges in testing a System-on-a-Chip (SOC) is dealing with the large test data size. To reduce the volume of test data, several efficient test data compression techniques have been recently proposed. In this paper, we propose hybrid test compression techniques that combine the G...

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التفاصيل البيبلوغرافية
المؤلف الرئيسي: El-Maleh, Aiman H. (author)
مؤلفون آخرون: unknown (author)
التنسيق: article
منشور في: 2003
الموضوعات:
الوصول للمادة أونلاين:https://eprints.kfupm.edu.sa/id/eprint/160/1/hybrid_compression_icecs2003.pdf
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_version_ 1864513388184338432
author El-Maleh, Aiman H.
author2 unknown
author2_role author
author_facet El-Maleh, Aiman H.
unknown
author_role author
dc.creator.none.fl_str_mv El-Maleh, Aiman H.
unknown
dc.date.none.fl_str_mv 2003-12
2020
dc.format.none.fl_str_mv application/pdf
dc.identifier.none.fl_str_mv https://eprints.kfupm.edu.sa/id/eprint/160/1/hybrid_compression_icecs2003.pdf
(2003) A Hybrid Test Compression Technique for Efficient Testing of Systems-on-a-Chip. 10th IEEE International Conference on Electronics, Circuits and Systems,. pp. 599-602.
dc.language.none.fl_str_mv en
dc.relation.none.fl_str_mv https://eprints.kfupm.edu.sa/id/eprint/160/
dc.rights.*.fl_str_mv info:eu-repo/semantics/openAccess
dc.subject.none.fl_str_mv Computer
dc.title.none.fl_str_mv A Hybrid Test Compression Technique for Efficient Testing of Systems-on-a-Chip
dc.type.none.fl_str_mv Article
PeerReviewed
info:eu-repo/semantics/publishedVersion
info:eu-repo/semantics/article
description One of the major challenges in testing a System-on-a-Chip (SOC) is dealing with the large test data size. To reduce the volume of test data, several efficient test data compression techniques have been recently proposed. In this paper, we propose hybrid test compression techniques that combine the Geometric-Primitives-Based compression technique with the frequency-directed run-length (FDR) and extended frequencydirected run-length (EFDR) coding techniques. Based on experimental results, we demonstrate the effectiveness of the proposed hybrid compression techniques in increasing the test data compression ratios over those obtained by the Geometric- Primitives-Based compression technique.
eu_rights_str_mv openAccess
format article
id KFUPM_058e1a4e04050db94d8a86dffa37ded3
identifier_str_mv (2003) A Hybrid Test Compression Technique for Efficient Testing of Systems-on-a-Chip. 10th IEEE International Conference on Electronics, Circuits and Systems,. pp. 599-602.
language_invalid_str_mv en
network_acronym_str KFUPM
network_name_str King Fahd University of Petroleum and Minerals
oai_identifier_str oai::160
publishDate 2003
repository.mail.fl_str_mv
repository.name.fl_str_mv
repository_id_str
spelling A Hybrid Test Compression Technique for Efficient Testing of Systems-on-a-ChipEl-Maleh, Aiman H.unknownComputerOne of the major challenges in testing a System-on-a-Chip (SOC) is dealing with the large test data size. To reduce the volume of test data, several efficient test data compression techniques have been recently proposed. In this paper, we propose hybrid test compression techniques that combine the Geometric-Primitives-Based compression technique with the frequency-directed run-length (FDR) and extended frequencydirected run-length (EFDR) coding techniques. Based on experimental results, we demonstrate the effectiveness of the proposed hybrid compression techniques in increasing the test data compression ratios over those obtained by the Geometric- Primitives-Based compression technique.2003-122020ArticlePeerReviewedinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttps://eprints.kfupm.edu.sa/id/eprint/160/1/hybrid_compression_icecs2003.pdf (2003) A Hybrid Test Compression Technique for Efficient Testing of Systems-on-a-Chip. 10th IEEE International Conference on Electronics, Circuits and Systems,. pp. 599-602. enhttps://eprints.kfupm.edu.sa/id/eprint/160/info:eu-repo/semantics/openAccessoai::1602019-11-01T13:22:40Z
spellingShingle A Hybrid Test Compression Technique for Efficient Testing of Systems-on-a-Chip
El-Maleh, Aiman H.
Computer
status_str publishedVersion
title A Hybrid Test Compression Technique for Efficient Testing of Systems-on-a-Chip
title_full A Hybrid Test Compression Technique for Efficient Testing of Systems-on-a-Chip
title_fullStr A Hybrid Test Compression Technique for Efficient Testing of Systems-on-a-Chip
title_full_unstemmed A Hybrid Test Compression Technique for Efficient Testing of Systems-on-a-Chip
title_short A Hybrid Test Compression Technique for Efficient Testing of Systems-on-a-Chip
title_sort A Hybrid Test Compression Technique for Efficient Testing of Systems-on-a-Chip
topic Computer
url https://eprints.kfupm.edu.sa/id/eprint/160/1/hybrid_compression_icecs2003.pdf