Transistor-Level Defect-Tolerant Techniques for Reliable Design at the Nanoscale

محفوظ في:
التفاصيل البيبلوغرافية
المؤلف الرئيسي: Khan, Farhan (author)
مؤلفون آخرون: unknown (author)
التنسيق: masterThesis
منشور في: 2009
الموضوعات:
الوصول للمادة أونلاين:https://eprints.kfupm.edu.sa/id/eprint/136151/1/Farhan_Thesis.pdf
الوسوم: إضافة وسم
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author Khan, Farhan
author2 unknown
author2_role author
author_facet Khan, Farhan
unknown
author_role author
dc.creator.none.fl_str_mv Khan, Farhan
unknown
dc.date.none.fl_str_mv 2009-09-26
2020
dc.format.none.fl_str_mv application/pdf
dc.identifier.none.fl_str_mv https://eprints.kfupm.edu.sa/id/eprint/136151/1/Farhan_Thesis.pdf
(2009) Transistor-Level Defect-Tolerant Techniques for Reliable Design at the Nanoscale. Masters thesis, King Fahd University of Petroleum and Minerals.
dc.language.none.fl_str_mv en
dc.relation.none.fl_str_mv https://eprints.kfupm.edu.sa/id/eprint/136151/
dc.rights.*.fl_str_mv info:eu-repo/semantics/openAccess
dc.subject.none.fl_str_mv Engineering
Computer
dc.title.none.fl_str_mv Transistor-Level Defect-Tolerant Techniques for Reliable Design at the Nanoscale
dc.type.none.fl_str_mv Thesis
NonPeerReviewed
info:eu-repo/semantics/publishedVersion
info:eu-repo/semantics/masterThesis
eu_rights_str_mv openAccess
format masterThesis
id KFUPM_0fb30c7270df1977ead87773fd2679a6
identifier_str_mv (2009) Transistor-Level Defect-Tolerant Techniques for Reliable Design at the Nanoscale. Masters thesis, King Fahd University of Petroleum and Minerals.
language_invalid_str_mv en
network_acronym_str KFUPM
network_name_str King Fahd University of Petroleum and Minerals
oai_identifier_str oai::136151
publishDate 2009
repository.mail.fl_str_mv
repository.name.fl_str_mv
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spelling Transistor-Level Defect-Tolerant Techniques for Reliable Design at the NanoscaleKhan, FarhanunknownEngineeringComputer2009-09-262020ThesisNonPeerReviewedinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/masterThesisapplication/pdfhttps://eprints.kfupm.edu.sa/id/eprint/136151/1/Farhan_Thesis.pdf (2009) Transistor-Level Defect-Tolerant Techniques for Reliable Design at the Nanoscale. Masters thesis, King Fahd University of Petroleum and Minerals. enhttps://eprints.kfupm.edu.sa/id/eprint/136151/info:eu-repo/semantics/openAccessoai::1361512019-11-01T14:11:15Z
spellingShingle Transistor-Level Defect-Tolerant Techniques for Reliable Design at the Nanoscale
Khan, Farhan
Engineering
Computer
status_str publishedVersion
title Transistor-Level Defect-Tolerant Techniques for Reliable Design at the Nanoscale
title_full Transistor-Level Defect-Tolerant Techniques for Reliable Design at the Nanoscale
title_fullStr Transistor-Level Defect-Tolerant Techniques for Reliable Design at the Nanoscale
title_full_unstemmed Transistor-Level Defect-Tolerant Techniques for Reliable Design at the Nanoscale
title_short Transistor-Level Defect-Tolerant Techniques for Reliable Design at the Nanoscale
title_sort Transistor-Level Defect-Tolerant Techniques for Reliable Design at the Nanoscale
topic Engineering
Computer
url https://eprints.kfupm.edu.sa/id/eprint/136151/1/Farhan_Thesis.pdf