DFT for controlled-impedance I/O buffers
This paper presents an architecture that enhances the testability of controlled-impedance buffers (CIBs). By testing CIBs digitally, the new architecture overcomes most of the problems with the traditional testing method. Most of these problems are test cost related. While reducing the test cost, th...
محفوظ في:
| المؤلف الرئيسي: | |
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| مؤلفون آخرون: | |
| التنسيق: | article |
| منشور في: |
2006
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| الموضوعات: | |
| الوصول للمادة أونلاين: | https://eprints.kfupm.edu.sa/id/eprint/14367/1/14367_1.pdf https://eprints.kfupm.edu.sa/id/eprint/14367/2/14367_2.doc |
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| _version_ | 1864513393744936960 |
|---|---|
| author | Al-Yamani, A.A. |
| author2 | unknown |
| author2_role | author |
| author_facet | Al-Yamani, A.A. unknown |
| author_role | author |
| dc.creator.none.fl_str_mv | Al-Yamani, A.A. unknown |
| dc.date.none.fl_str_mv | 2006-07 2020 |
| dc.format.none.fl_str_mv | application/pdf application/msword |
| dc.identifier.none.fl_str_mv | https://eprints.kfupm.edu.sa/id/eprint/14367/1/14367_1.pdf https://eprints.kfupm.edu.sa/id/eprint/14367/2/14367_2.doc (2006) DFT for controlled-impedance I/O buffers. Design Automation Conference, 2006 43rd ACM/IEEE, 1. |
| dc.language.none.fl_str_mv | en en |
| dc.publisher.none.fl_str_mv | IEEE |
| dc.relation.none.fl_str_mv | https://eprints.kfupm.edu.sa/id/eprint/14367/ |
| dc.rights.*.fl_str_mv | info:eu-repo/semantics/openAccess |
| dc.subject.none.fl_str_mv | Computer |
| dc.title.none.fl_str_mv | DFT for controlled-impedance I/O buffers |
| dc.type.none.fl_str_mv | Article PeerReviewed info:eu-repo/semantics/publishedVersion info:eu-repo/semantics/article |
| description | This paper presents an architecture that enhances the testability of controlled-impedance buffers (CIBs). By testing CIBs digitally, the new architecture overcomes most of the problems with the traditional testing method. Most of these problems are test cost related. While reducing the test cost, the new architecture allows for higher test quality that even includes delay testing capabilities. |
| eu_rights_str_mv | openAccess |
| format | article |
| id | KFUPM_225ec763afc1b228bea616eba5c2277e |
| identifier_str_mv | (2006) DFT for controlled-impedance I/O buffers. Design Automation Conference, 2006 43rd ACM/IEEE, 1. |
| language_invalid_str_mv | en |
| network_acronym_str | KFUPM |
| network_name_str | King Fahd University of Petroleum and Minerals |
| oai_identifier_str | oai::14367 |
| publishDate | 2006 |
| publisher.none.fl_str_mv | IEEE |
| repository.mail.fl_str_mv | |
| repository.name.fl_str_mv | |
| repository_id_str | |
| spelling | DFT for controlled-impedance I/O buffersAl-Yamani, A.A.unknownComputerThis paper presents an architecture that enhances the testability of controlled-impedance buffers (CIBs). By testing CIBs digitally, the new architecture overcomes most of the problems with the traditional testing method. Most of these problems are test cost related. While reducing the test cost, the new architecture allows for higher test quality that even includes delay testing capabilities.IEEE2006-072020ArticlePeerReviewedinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfapplication/mswordhttps://eprints.kfupm.edu.sa/id/eprint/14367/1/14367_1.pdfhttps://eprints.kfupm.edu.sa/id/eprint/14367/2/14367_2.doc (2006) DFT for controlled-impedance I/O buffers. Design Automation Conference, 2006 43rd ACM/IEEE, 1. enenhttps://eprints.kfupm.edu.sa/id/eprint/14367/info:eu-repo/semantics/openAccessoai::143672019-11-01T14:05:31Z |
| spellingShingle | DFT for controlled-impedance I/O buffers Al-Yamani, A.A. Computer |
| status_str | publishedVersion |
| title | DFT for controlled-impedance I/O buffers |
| title_full | DFT for controlled-impedance I/O buffers |
| title_fullStr | DFT for controlled-impedance I/O buffers |
| title_full_unstemmed | DFT for controlled-impedance I/O buffers |
| title_short | DFT for controlled-impedance I/O buffers |
| title_sort | DFT for controlled-impedance I/O buffers |
| topic | Computer |
| url | https://eprints.kfupm.edu.sa/id/eprint/14367/1/14367_1.pdf https://eprints.kfupm.edu.sa/id/eprint/14367/2/14367_2.doc |