A class-based clustering static compaction technique for combinational circuits
Static compaction based on test vector merging is a very simple and efficient technique. However, for a highly incompatible test set, merging achieves little reduction. In this paper, we propose a new static compaction technique in which a test vector is decomposed into its atomic components before...
Saved in:
| Main Author: | |
|---|---|
| Other Authors: | , |
| Format: | article |
| Published: |
2004
|
| Subjects: | |
| Online Access: | https://eprints.kfupm.edu.sa/id/eprint/14771/1/14771_1.pdf https://eprints.kfupm.edu.sa/id/eprint/14771/2/14771_2.doc |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|