A class-based clustering static compaction technique for combinational circuits

Static compaction based on test vector merging is a very simple and efficient technique. However, for a highly incompatible test set, merging achieves little reduction. In this paper, we propose a new static compaction technique in which a test vector is decomposed into its atomic components before...

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Bibliographic Details
Main Author: El-Maleh, A.H. (author)
Other Authors: Osais, Y.E. (author), unknown (author)
Format: article
Published: 2004
Subjects:
Online Access:https://eprints.kfupm.edu.sa/id/eprint/14771/1/14771_1.pdf
https://eprints.kfupm.edu.sa/id/eprint/14771/2/14771_2.doc
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