Khursheed, S. S., & unknown. (2004). Test set compaction for sequential circuits based on test relaxation.
Chicago Style (17th ed.) CitationKhursheed, Syed Saqib, and unknown. Test Set Compaction for Sequential Circuits Based on Test Relaxation. 2004.
MLA (9th ed.) CitationKhursheed, Syed Saqib, and unknown. Test Set Compaction for Sequential Circuits Based on Test Relaxation. 2004.
Warning: These citations may not always be 100% accurate.