Test set compaction for sequential circuits based on test relaxation

Test set compaction for sequential circuits based on test relaxation

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Bibliographic Details
Main Author:	Khursheed, Syed Saqib (author)
Other Authors:	unknown (author)
Format:	masterThesis
Published:	2004
Subjects:	Computer
Online Access:	https://eprints.kfupm.edu.sa/id/eprint/10526/1/10526.pdf
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