Fault characterization and testability considerations in multi-valued logic circuits.
محفوظ في:
| المؤلف الرئيسي: | |
|---|---|
| مؤلفون آخرون: | |
| التنسيق: | masterThesis |
| منشور في: |
1998
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| الموضوعات: | |
| الوصول للمادة أونلاين: | https://eprints.kfupm.edu.sa/id/eprint/10336/1/10336.pdf |
| الوسوم: |
إضافة وسم
لا توجد وسوم, كن أول من يضع وسما على هذه التسجيلة!
|
| _version_ | 1864513402295025665 |
|---|---|
| author | Al-Sharif, Maher Mohammed Mahmoud |
| author2 | unknown |
| author2_role | author |
| author_facet | Al-Sharif, Maher Mohammed Mahmoud unknown |
| author_role | author |
| dc.creator.none.fl_str_mv | Al-Sharif, Maher Mohammed Mahmoud unknown |
| dc.date.none.fl_str_mv | 1998-12 2020 |
| dc.format.none.fl_str_mv | application/pdf |
| dc.identifier.none.fl_str_mv | https://eprints.kfupm.edu.sa/id/eprint/10336/1/10336.pdf (1998) Fault characterization and testability considerations in multi-valued logic circuits. Masters thesis, King Fahd University of Petroleum and Minerals. |
| dc.language.none.fl_str_mv | en |
| dc.relation.none.fl_str_mv | https://eprints.kfupm.edu.sa/id/eprint/10336/ |
| dc.rights.*.fl_str_mv | info:eu-repo/semantics/openAccess |
| dc.subject.none.fl_str_mv | Computer |
| dc.title.none.fl_str_mv | Fault characterization and testability considerations in multi-valued logic circuits. |
| dc.type.none.fl_str_mv | Thesis NonPeerReviewed info:eu-repo/semantics/publishedVersion info:eu-repo/semantics/masterThesis |
| eu_rights_str_mv | openAccess |
| format | masterThesis |
| id | KFUPM_51ff824807953625f6262cb3b7a3f3f3 |
| identifier_str_mv | (1998) Fault characterization and testability considerations in multi-valued logic circuits. Masters thesis, King Fahd University of Petroleum and Minerals. |
| language_invalid_str_mv | en |
| network_acronym_str | KFUPM |
| network_name_str | King Fahd University of Petroleum and Minerals |
| oai_identifier_str | oai::10336 |
| publishDate | 1998 |
| repository.mail.fl_str_mv | |
| repository.name.fl_str_mv | |
| repository_id_str | |
| spelling | Fault characterization and testability considerations in multi-valued logic circuits.Al-Sharif, Maher Mohammed MahmoudunknownComputer1998-122020ThesisNonPeerReviewedinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/masterThesisapplication/pdfhttps://eprints.kfupm.edu.sa/id/eprint/10336/1/10336.pdf (1998) Fault characterization and testability considerations in multi-valued logic circuits. Masters thesis, King Fahd University of Petroleum and Minerals. enhttps://eprints.kfupm.edu.sa/id/eprint/10336/info:eu-repo/semantics/openAccessoai::103362019-11-01T13:59:59Z |
| spellingShingle | Fault characterization and testability considerations in multi-valued logic circuits. Al-Sharif, Maher Mohammed Mahmoud Computer |
| status_str | publishedVersion |
| title | Fault characterization and testability considerations in multi-valued logic circuits. |
| title_full | Fault characterization and testability considerations in multi-valued logic circuits. |
| title_fullStr | Fault characterization and testability considerations in multi-valued logic circuits. |
| title_full_unstemmed | Fault characterization and testability considerations in multi-valued logic circuits. |
| title_short | Fault characterization and testability considerations in multi-valued logic circuits. |
| title_sort | Fault characterization and testability considerations in multi-valued logic circuits. |
| topic | Computer |
| url | https://eprints.kfupm.edu.sa/id/eprint/10336/1/10336.pdf |