El-Maleh, A. H., Khursheed, S. S., & unknown. (2006). Efficient Test Compaction for Combinational Circuits Based on Fault Detection Count-Directed Clustering.
Chicago Style (17th ed.) CitationEl-Maleh, Aiman H., S. Saqib Khursheed, and unknown. Efficient Test Compaction for Combinational Circuits Based on Fault Detection Count-Directed Clustering. 2006.
MLA (9th ed.) CitationEl-Maleh, Aiman H., et al. Efficient Test Compaction for Combinational Circuits Based on Fault Detection Count-Directed Clustering. 2006.
Warning: These citations may not always be 100% accurate.