Efficient Test Compaction for Combinational Circuits Based on Fault Detection Count-Directed Clustering
Test compaction is an effective technique for reducing test data volume and test application time. In this paper, we present a new static test compaction algorithm based on test vector decomposition and clustering. Test vectors are decomposed and clustered in an increasing order of faults detection...
محفوظ في:
| المؤلف الرئيسي: | |
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| مؤلفون آخرون: | , |
| التنسيق: | article |
| منشور في: |
2006
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| الموضوعات: | |
| الوصول للمادة أونلاين: | https://eprints.kfupm.edu.sa/id/eprint/157/1/Efficient_Test_Compaction_for_Combinational_Circuits_IDT2006.pdf |
| الوسوم: |
إضافة وسم
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| _version_ | 1864513379772661760 |
|---|---|
| author | El-Maleh, Aiman H. |
| author2 | Khursheed, S. Saqib unknown |
| author2_role | author author |
| author_facet | El-Maleh, Aiman H. Khursheed, S. Saqib unknown |
| author_role | author |
| dc.creator.none.fl_str_mv | El-Maleh, Aiman H. Khursheed, S. Saqib unknown |
| dc.date.none.fl_str_mv | 2006-11-19 2020 |
| dc.format.none.fl_str_mv | application/pdf |
| dc.identifier.none.fl_str_mv | https://eprints.kfupm.edu.sa/id/eprint/157/1/Efficient_Test_Compaction_for_Combinational_Circuits_IDT2006.pdf (2006) Efficient Test Compaction for Combinational Circuits Based on Fault Detection Count-Directed Clustering. IEEE Int. Design and Test Workshop. |
| dc.language.none.fl_str_mv | en |
| dc.relation.none.fl_str_mv | https://eprints.kfupm.edu.sa/id/eprint/157/ |
| dc.rights.*.fl_str_mv | info:eu-repo/semantics/openAccess |
| dc.subject.none.fl_str_mv | Computer |
| dc.title.none.fl_str_mv | Efficient Test Compaction for Combinational Circuits Based on Fault Detection Count-Directed Clustering |
| dc.type.none.fl_str_mv | Article PeerReviewed info:eu-repo/semantics/publishedVersion info:eu-repo/semantics/article |
| description | Test compaction is an effective technique for reducing test data volume and test application time. In this paper, we present a new static test compaction algorithm based on test vector decomposition and clustering. Test vectors are decomposed and clustered in an increasing order of faults detection count. This clustering order gives more degree of freedom and results in better compaction. Experimental results demonstrate the effectiveness of the proposed approach in achieving higher compaction in a much more efficient CPU time than previous clustering-based test compaction approaches. |
| eu_rights_str_mv | openAccess |
| format | article |
| id | KFUPM_52411d75602ee4364d3d0f38cd6d9173 |
| identifier_str_mv | (2006) Efficient Test Compaction for Combinational Circuits Based on Fault Detection Count-Directed Clustering. IEEE Int. Design and Test Workshop. |
| language_invalid_str_mv | en |
| network_acronym_str | KFUPM |
| network_name_str | King Fahd University of Petroleum and Minerals |
| oai_identifier_str | oai::157 |
| publishDate | 2006 |
| repository.mail.fl_str_mv | |
| repository.name.fl_str_mv | |
| repository_id_str | |
| spelling | Efficient Test Compaction for Combinational Circuits Based on Fault Detection Count-Directed ClusteringEl-Maleh, Aiman H.Khursheed, S. SaqibunknownComputerTest compaction is an effective technique for reducing test data volume and test application time. In this paper, we present a new static test compaction algorithm based on test vector decomposition and clustering. Test vectors are decomposed and clustered in an increasing order of faults detection count. This clustering order gives more degree of freedom and results in better compaction. Experimental results demonstrate the effectiveness of the proposed approach in achieving higher compaction in a much more efficient CPU time than previous clustering-based test compaction approaches.2006-11-192020ArticlePeerReviewedinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttps://eprints.kfupm.edu.sa/id/eprint/157/1/Efficient_Test_Compaction_for_Combinational_Circuits_IDT2006.pdf (2006) Efficient Test Compaction for Combinational Circuits Based on Fault Detection Count-Directed Clustering. IEEE Int. Design and Test Workshop. enhttps://eprints.kfupm.edu.sa/id/eprint/157/info:eu-repo/semantics/openAccessoai::1572019-11-01T13:22:39Z |
| spellingShingle | Efficient Test Compaction for Combinational Circuits Based on Fault Detection Count-Directed Clustering El-Maleh, Aiman H. Computer |
| status_str | publishedVersion |
| title | Efficient Test Compaction for Combinational Circuits Based on Fault Detection Count-Directed Clustering |
| title_full | Efficient Test Compaction for Combinational Circuits Based on Fault Detection Count-Directed Clustering |
| title_fullStr | Efficient Test Compaction for Combinational Circuits Based on Fault Detection Count-Directed Clustering |
| title_full_unstemmed | Efficient Test Compaction for Combinational Circuits Based on Fault Detection Count-Directed Clustering |
| title_short | Efficient Test Compaction for Combinational Circuits Based on Fault Detection Count-Directed Clustering |
| title_sort | Efficient Test Compaction for Combinational Circuits Based on Fault Detection Count-Directed Clustering |
| topic | Computer |
| url | https://eprints.kfupm.edu.sa/id/eprint/157/1/Efficient_Test_Compaction_for_Combinational_Circuits_IDT2006.pdf |