Extended Frequency-Directed Run-Length Code with Improved Application to System-on-a-Chip Test Data Compression
One of the major challenges in testing a System-on-a-Chip (SOC) is dealing with the large test data size. To reduce the volume of test data, several test data compression techniques have been proposed. Frequency-directed run-length (FDR) code is a variable-to-variable run length code based on encodi...
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| Format: | article |
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2002
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| Online Access: | https://eprints.kfupm.edu.sa/id/eprint/159/1/Extended_Frequency-Directed_Run-Length_Code__icecs2002.pdf |
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| _version_ | 1864513388183289856 |
|---|---|
| author | El-Maleh, Aiman H. |
| author2 | Al-Abaji, Raslan H. unknown |
| author2_role | author author |
| author_facet | El-Maleh, Aiman H. Al-Abaji, Raslan H. unknown |
| author_role | author |
| dc.creator.none.fl_str_mv | El-Maleh, Aiman H. Al-Abaji, Raslan H. unknown |
| dc.date.none.fl_str_mv | 2002-09 2020 |
| dc.format.none.fl_str_mv | application/pdf |
| dc.identifier.none.fl_str_mv | https://eprints.kfupm.edu.sa/id/eprint/159/1/Extended_Frequency-Directed_Run-Length_Code__icecs2002.pdf (2002) Extended Frequency-Directed Run-Length Code with Improved Application to System-on-a-Chip Test Data Compression. 9th IEEE International Conference on Electronics, Circuits and Systems. pp. 449-452. |
| dc.language.none.fl_str_mv | en |
| dc.relation.none.fl_str_mv | https://eprints.kfupm.edu.sa/id/eprint/159/ |
| dc.rights.*.fl_str_mv | info:eu-repo/semantics/openAccess |
| dc.subject.none.fl_str_mv | Computer |
| dc.title.none.fl_str_mv | Extended Frequency-Directed Run-Length Code with Improved Application to System-on-a-Chip Test Data Compression |
| dc.type.none.fl_str_mv | Article PeerReviewed info:eu-repo/semantics/publishedVersion info:eu-repo/semantics/article |
| description | One of the major challenges in testing a System-on-a-Chip (SOC) is dealing with the large test data size. To reduce the volume of test data, several test data compression techniques have been proposed. Frequency-directed run-length (FDR) code is a variable-to-variable run length code based on encoding runs of 0’s. In this work, we demonstrate that higher test data compression can be achieved based on encoding both runs of 0’s and 1’s. We propose an extension to the FDR code and demonstrate by experimental results its effectiveness in achieving higher compression ratio. |
| eu_rights_str_mv | openAccess |
| format | article |
| id | KFUPM_5510c21158a96331bac881dbaed7089b |
| identifier_str_mv | (2002) Extended Frequency-Directed Run-Length Code with Improved Application to System-on-a-Chip Test Data Compression. 9th IEEE International Conference on Electronics, Circuits and Systems. pp. 449-452. |
| language_invalid_str_mv | en |
| network_acronym_str | KFUPM |
| network_name_str | King Fahd University of Petroleum and Minerals |
| oai_identifier_str | oai::159 |
| publishDate | 2002 |
| repository.mail.fl_str_mv | |
| repository.name.fl_str_mv | |
| repository_id_str | |
| spelling | Extended Frequency-Directed Run-Length Code with Improved Application to System-on-a-Chip Test Data CompressionEl-Maleh, Aiman H.Al-Abaji, Raslan H.unknownComputerOne of the major challenges in testing a System-on-a-Chip (SOC) is dealing with the large test data size. To reduce the volume of test data, several test data compression techniques have been proposed. Frequency-directed run-length (FDR) code is a variable-to-variable run length code based on encoding runs of 0’s. In this work, we demonstrate that higher test data compression can be achieved based on encoding both runs of 0’s and 1’s. We propose an extension to the FDR code and demonstrate by experimental results its effectiveness in achieving higher compression ratio.2002-092020ArticlePeerReviewedinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttps://eprints.kfupm.edu.sa/id/eprint/159/1/Extended_Frequency-Directed_Run-Length_Code__icecs2002.pdf (2002) Extended Frequency-Directed Run-Length Code with Improved Application to System-on-a-Chip Test Data Compression. 9th IEEE International Conference on Electronics, Circuits and Systems. pp. 449-452. enhttps://eprints.kfupm.edu.sa/id/eprint/159/info:eu-repo/semantics/openAccessoai::1592019-11-01T13:22:40Z |
| spellingShingle | Extended Frequency-Directed Run-Length Code with Improved Application to System-on-a-Chip Test Data Compression El-Maleh, Aiman H. Computer |
| status_str | publishedVersion |
| title | Extended Frequency-Directed Run-Length Code with Improved Application to System-on-a-Chip Test Data Compression |
| title_full | Extended Frequency-Directed Run-Length Code with Improved Application to System-on-a-Chip Test Data Compression |
| title_fullStr | Extended Frequency-Directed Run-Length Code with Improved Application to System-on-a-Chip Test Data Compression |
| title_full_unstemmed | Extended Frequency-Directed Run-Length Code with Improved Application to System-on-a-Chip Test Data Compression |
| title_short | Extended Frequency-Directed Run-Length Code with Improved Application to System-on-a-Chip Test Data Compression |
| title_sort | Extended Frequency-Directed Run-Length Code with Improved Application to System-on-a-Chip Test Data Compression |
| topic | Computer |
| url | https://eprints.kfupm.edu.sa/id/eprint/159/1/Extended_Frequency-Directed_Run-Length_Code__icecs2002.pdf |