Extended Frequency-Directed Run-Length Code with Improved Application to System-on-a-Chip Test Data Compression

One of the major challenges in testing a System-on-a-Chip (SOC) is dealing with the large test data size. To reduce the volume of test data, several test data compression techniques have been proposed. Frequency-directed run-length (FDR) code is a variable-to-variable run length code based on encodi...

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Bibliographic Details
Main Author: El-Maleh, Aiman H. (author)
Other Authors: Al-Abaji, Raslan H. (author), unknown (author)
Format: article
Published: 2002
Subjects:
Online Access:https://eprints.kfupm.edu.sa/id/eprint/159/1/Extended_Frequency-Directed_Run-Length_Code__icecs2002.pdf
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