Generic DFT approach for pattern sensitive faults in word-orientedmemories
The testability problem of word-oriented memories (WOMs) for pattern sensitive faults is addressed. A novel design for testability (DFT) strategy allows efficient built-in self-testing (BIST) of WOMs. By proper selection of the memory array tiling scheme, it is possible to implement O(n) BIST algori...
محفوظ في:
| المؤلف الرئيسي: | |
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| مؤلفون آخرون: | , , |
| التنسيق: | article |
| منشور في: |
1996
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| الموضوعات: | |
| الوصول للمادة أونلاين: | https://eprints.kfupm.edu.sa/id/eprint/14484/1/14484_1.pdf https://eprints.kfupm.edu.sa/id/eprint/14484/2/14484_2.doc |
| الوسوم: |
إضافة وسم
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| _version_ | 1864513393807851520 |
|---|---|
| author | Amin, A.A. |
| author2 | Hamzah, A.A. Abdel-Aal, R.E. unknown |
| author2_role | author author author |
| author_facet | Amin, A.A. Hamzah, A.A. Abdel-Aal, R.E. unknown |
| author_role | author |
| dc.creator.none.fl_str_mv | Amin, A.A. Hamzah, A.A. Abdel-Aal, R.E. unknown |
| dc.date.none.fl_str_mv | 1996-05 2020 |
| dc.format.none.fl_str_mv | application/pdf application/msword |
| dc.identifier.none.fl_str_mv | https://eprints.kfupm.edu.sa/id/eprint/14484/1/14484_1.pdf https://eprints.kfupm.edu.sa/id/eprint/14484/2/14484_2.doc (1996) Generic DFT approach for pattern sensitive faults in word-orientedmemories. Computers and Digital Techniques, IEE Proceedings -, 143. |
| dc.language.none.fl_str_mv | en en |
| dc.publisher.none.fl_str_mv | IEEE |
| dc.relation.none.fl_str_mv | https://eprints.kfupm.edu.sa/id/eprint/14484/ |
| dc.rights.*.fl_str_mv | info:eu-repo/semantics/openAccess |
| dc.subject.none.fl_str_mv | Computer |
| dc.title.none.fl_str_mv | Generic DFT approach for pattern sensitive faults in word-orientedmemories |
| dc.type.none.fl_str_mv | Article PeerReviewed info:eu-repo/semantics/publishedVersion info:eu-repo/semantics/article |
| description | The testability problem of word-oriented memories (WOMs) for pattern sensitive faults is addressed. A novel design for testability (DFT) strategy allows efficient built-in self-testing (BIST) of WOMs. By proper selection of the memory array tiling scheme, it is possible to implement O(n) BIST algorithms which test WOMs for various types of neighbourhood pattern sensitive faults (NPSFs). The inputs of the column decoders are modified to allow parallel writing into multiple words, and coincidence comparators are added to allow parallel verification of row data with minimal effect on chip area and performance |
| eu_rights_str_mv | openAccess |
| format | article |
| id | KFUPM_5ea6ef9ecfd71d04ae1e0c252e6522fe |
| identifier_str_mv | (1996) Generic DFT approach for pattern sensitive faults in word-orientedmemories. Computers and Digital Techniques, IEE Proceedings -, 143. |
| language_invalid_str_mv | en |
| network_acronym_str | KFUPM |
| network_name_str | King Fahd University of Petroleum and Minerals |
| oai_identifier_str | oai::14484 |
| publishDate | 1996 |
| publisher.none.fl_str_mv | IEEE |
| repository.mail.fl_str_mv | |
| repository.name.fl_str_mv | |
| repository_id_str | |
| spelling | Generic DFT approach for pattern sensitive faults in word-orientedmemoriesAmin, A.A.Hamzah, A.A.Abdel-Aal, R.E.unknownComputerThe testability problem of word-oriented memories (WOMs) for pattern sensitive faults is addressed. A novel design for testability (DFT) strategy allows efficient built-in self-testing (BIST) of WOMs. By proper selection of the memory array tiling scheme, it is possible to implement O(n) BIST algorithms which test WOMs for various types of neighbourhood pattern sensitive faults (NPSFs). The inputs of the column decoders are modified to allow parallel writing into multiple words, and coincidence comparators are added to allow parallel verification of row data with minimal effect on chip area and performanceIEEE1996-052020ArticlePeerReviewedinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfapplication/mswordhttps://eprints.kfupm.edu.sa/id/eprint/14484/1/14484_1.pdfhttps://eprints.kfupm.edu.sa/id/eprint/14484/2/14484_2.doc (1996) Generic DFT approach for pattern sensitive faults in word-orientedmemories. Computers and Digital Techniques, IEE Proceedings -, 143. enenhttps://eprints.kfupm.edu.sa/id/eprint/14484/info:eu-repo/semantics/openAccessoai::144842019-11-01T14:06:01Z |
| spellingShingle | Generic DFT approach for pattern sensitive faults in word-orientedmemories Amin, A.A. Computer |
| status_str | publishedVersion |
| title | Generic DFT approach for pattern sensitive faults in word-orientedmemories |
| title_full | Generic DFT approach for pattern sensitive faults in word-orientedmemories |
| title_fullStr | Generic DFT approach for pattern sensitive faults in word-orientedmemories |
| title_full_unstemmed | Generic DFT approach for pattern sensitive faults in word-orientedmemories |
| title_short | Generic DFT approach for pattern sensitive faults in word-orientedmemories |
| title_sort | Generic DFT approach for pattern sensitive faults in word-orientedmemories |
| topic | Computer |
| url | https://eprints.kfupm.edu.sa/id/eprint/14484/1/14484_1.pdf https://eprints.kfupm.edu.sa/id/eprint/14484/2/14484_2.doc |