Generic DFT approach for pattern sensitive faults in word-orientedmemories
The testability problem of word-oriented memories (WOMs) for pattern sensitive faults is addressed. A novel design for testability (DFT) strategy allows efficient built-in self-testing (BIST) of WOMs. By proper selection of the memory array tiling scheme, it is possible to implement O(n) BIST algori...
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| Other Authors: | , , |
| Format: | article |
| Published: |
1996
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| Online Access: | https://eprints.kfupm.edu.sa/id/eprint/14484/1/14484_1.pdf https://eprints.kfupm.edu.sa/id/eprint/14484/2/14484_2.doc |
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