APA (7th ed.) Citation

Abd-El-Barr, M., Al-Sherif, M., Osman, M., & unknown. (1999). Fault characterization and testability considerations inmulti-valued logic circuits.

Chicago Style (17th ed.) Citation

Abd-El-Barr, Mostafa, M. Al-Sherif, M. Osman, and unknown. Fault Characterization and Testability Considerations Inmulti-valued Logic Circuits. 1999.

MLA (9th ed.) Citation

Abd-El-Barr, Mostafa, et al. Fault Characterization and Testability Considerations Inmulti-valued Logic Circuits. 1999.