Fault characterization and testability considerations inmulti-valued logic circuits
With the growing interest and the emergence of various implementations of Multiple-Valued logic (MVL) circuits, testability issues of these circuits are becoming crucial. Fault characterization is an early step in the test generation process. It is aimed at finding fault models that best describe th...
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1999
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| Online Access: | https://eprints.kfupm.edu.sa/id/eprint/14028/1/14028_1.pdf https://eprints.kfupm.edu.sa/id/eprint/14028/2/14028_2.doc |
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