On efficient extraction of partially specified test sets for synchronous sequential circuits

On efficient extraction of partially specified test sets for synchronous sequential circuits

Testing systems-on-a-chip (SOC) involves applying huge amounts of test data, which is stored in the tester memory and then transferred to the circuit under test (CUT) during test application. Therefore, practical techniques, such as test compression and compaction, are required to reduce the amount...

وصف كامل

محفوظ في:

التفاصيل البيبلوغرافية
المؤلف الرئيسي:	El-Maleh, A. (author)
مؤلفون آخرون:	Al-Utaibi, K. (author), unknown (author)
التنسيق:	article
منشور في:	2003
الموضوعات:	Computer
الوصول للمادة أونلاين:	https://eprints.kfupm.edu.sa/id/eprint/14799/1/14799_1.pdf https://eprints.kfupm.edu.sa/id/eprint/14799/2/14799_2.doc
الوسوم:	إضافة وسم لا توجد وسوم, كن أول من يضع وسما على هذه التسجيلة!

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