X-ray absorption near edge structure investigation of vanadium-doped ZnO thin films
Abstract X-ray absorption near edge structure spectroscopy has been used to investigate the electronic and atomic structure of vanadium-doped ZnO thin films obtained by reactive plasma. The results show no sign of metallic clustering of Vatoms, +4 oxidation state of V, 4-fold coordination of Zn in t...
Saved in:
| Main Author: | |
|---|---|
| Other Authors: | , , , , |
| Format: | article |
| Published: |
2020
|
| Subjects: | |
| Online Access: | https://eprints.kfupm.edu.sa/id/eprint/523/1/FaizTabetetal.pdf |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|