A Fault Independent Test Generation Method For Combinational Logic Circuits
محفوظ في:
| المؤلف الرئيسي: | |
|---|---|
| مؤلفون آخرون: | |
| التنسيق: | masterThesis |
| منشور في: |
1992
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| الموضوعات: | |
| الوصول للمادة أونلاين: | https://eprints.kfupm.edu.sa/id/eprint/1902/1/1354050.pdf |
| الوسوم: |
إضافة وسم
لا توجد وسوم, كن أول من يضع وسما على هذه التسجيلة!
|
| _version_ | 1864513390178729984 |
|---|---|
| author | Al-Deeb, Mohamed Mahdy |
| author2 | unknown |
| author2_role | author |
| author_facet | Al-Deeb, Mohamed Mahdy unknown |
| author_role | author |
| dc.creator.none.fl_str_mv | Al-Deeb, Mohamed Mahdy unknown |
| dc.date.none.fl_str_mv | 1992-06 2020 |
| dc.format.none.fl_str_mv | application/pdf |
| dc.identifier.none.fl_str_mv | https://eprints.kfupm.edu.sa/id/eprint/1902/1/1354050.pdf (1992) A Fault Independent Test Generation Method For Combinational Logic Circuits. Masters thesis, KING FAHD UNIVERSITY OF PETROLEUM & MINERALS. |
| dc.language.none.fl_str_mv | en |
| dc.relation.none.fl_str_mv | https://eprints.kfupm.edu.sa/id/eprint/1902/ |
| dc.rights.*.fl_str_mv | info:eu-repo/semantics/openAccess |
| dc.subject.none.fl_str_mv | Computer |
| dc.title.none.fl_str_mv | A Fault Independent Test Generation Method For Combinational Logic Circuits |
| dc.type.none.fl_str_mv | Thesis NonPeerReviewed info:eu-repo/semantics/publishedVersion info:eu-repo/semantics/masterThesis |
| eu_rights_str_mv | openAccess |
| format | masterThesis |
| id | KFUPM_8eeb18eaba57929db77a7b4461c09448 |
| identifier_str_mv | (1992) A Fault Independent Test Generation Method For Combinational Logic Circuits. Masters thesis, KING FAHD UNIVERSITY OF PETROLEUM & MINERALS. |
| language_invalid_str_mv | en |
| network_acronym_str | KFUPM |
| network_name_str | King Fahd University of Petroleum and Minerals |
| oai_identifier_str | oai::1902 |
| publishDate | 1992 |
| repository.mail.fl_str_mv | |
| repository.name.fl_str_mv | |
| repository_id_str | |
| spelling | A Fault Independent Test Generation Method For Combinational Logic CircuitsAl-Deeb, Mohamed MahdyunknownComputer1992-062020ThesisNonPeerReviewedinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/masterThesisapplication/pdfhttps://eprints.kfupm.edu.sa/id/eprint/1902/1/1354050.pdf (1992) A Fault Independent Test Generation Method For Combinational Logic Circuits. Masters thesis, KING FAHD UNIVERSITY OF PETROLEUM & MINERALS. enhttps://eprints.kfupm.edu.sa/id/eprint/1902/info:eu-repo/semantics/openAccessoai::19022019-11-01T13:29:17Z |
| spellingShingle | A Fault Independent Test Generation Method For Combinational Logic Circuits Al-Deeb, Mohamed Mahdy Computer |
| status_str | publishedVersion |
| title | A Fault Independent Test Generation Method For Combinational Logic Circuits |
| title_full | A Fault Independent Test Generation Method For Combinational Logic Circuits |
| title_fullStr | A Fault Independent Test Generation Method For Combinational Logic Circuits |
| title_full_unstemmed | A Fault Independent Test Generation Method For Combinational Logic Circuits |
| title_short | A Fault Independent Test Generation Method For Combinational Logic Circuits |
| title_sort | A Fault Independent Test Generation Method For Combinational Logic Circuits |
| topic | Computer |
| url | https://eprints.kfupm.edu.sa/id/eprint/1902/1/1354050.pdf |