Efficient Test Compaction for Combinational Circuits Based on Fault Detection Count-Directed Clustering
Test compaction is an effective technique for reducing test data volume and test application time. In this paper, we present a new static test compaction technique based on test vector decomposition and clustering. Test vectors are decomposed and clustered for faults in an increasing order of faults...
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| Other Authors: | , |
| Format: | article |
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2007
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| Online Access: | https://eprints.kfupm.edu.sa/id/eprint/158/1/Efficient_Test_Compaction_for_Combinational_Circuits_IET2006.pdf |
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