Fork-Coupled Resonators for High Frequency Characterization of Dielectric Substrate Materials

Abstract—Efficient coupling of energy in and out of a resonator can significantly enhance its performance, particularly when used for dielectric characterization of materials. In this paper, a new microstrip resonator is introduced, which uses fork-shaped feed elements for improving the coupling eff...

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Main Author: Muqaibel, A. (author)
Other Authors: Safaai-Jazi, A. (author), Riad, S. (author), unknown (author)
Format: article
Published: 2006
Subjects:
Online Access:https://eprints.kfupm.edu.sa/id/eprint/1224/1/ddd.pdf
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author Muqaibel, A.
author2 Safaai-Jazi, A.
Riad, S.
unknown
author2_role author
author
author
author_facet Muqaibel, A.
Safaai-Jazi, A.
Riad, S.
unknown
author_role author
dc.creator.none.fl_str_mv Muqaibel, A.
Safaai-Jazi, A.
Riad, S.
unknown
dc.date.none.fl_str_mv 2006-12
2020
dc.format.none.fl_str_mv application/pdf
dc.identifier.none.fl_str_mv https://eprints.kfupm.edu.sa/id/eprint/1224/1/ddd.pdf
(2006) Fork-Coupled Resonators for High Frequency Characterization of Dielectric Substrate Materials. IEEE Transactions on Instrumentation and Measurements, 55 (6). pp. 2216-2220.
dc.language.none.fl_str_mv en
dc.relation.none.fl_str_mv https://eprints.kfupm.edu.sa/id/eprint/1224/
dc.rights.*.fl_str_mv info:eu-repo/semantics/openAccess
dc.subject.none.fl_str_mv Electrical
dc.title.none.fl_str_mv Fork-Coupled Resonators for High Frequency Characterization of Dielectric Substrate Materials
dc.type.none.fl_str_mv Article
PeerReviewed
info:eu-repo/semantics/publishedVersion
info:eu-repo/semantics/article
description Abstract—Efficient coupling of energy in and out of a resonator can significantly enhance its performance, particularly when used for dielectric characterization of materials. In this paper, a new microstrip resonator is introduced, which uses fork-shaped feed elements for improving the coupling efficiency. The proposed resonator is studied both experimentally and theoretically with field simulation software. An important advantage of the fork microstrip resonator is attributed to its single-layer geometry and easier manufacturing processes. This resonator is used to characterize three different dielectric materials. Comparison of measurement results from the fork resonator with those obtained with a stripline resonator suggests that the proposed resonator offers a superior performance.
eu_rights_str_mv openAccess
format article
id KFUPM_92d2f61515f4bf2e9aa2bb0849fc7d77
identifier_str_mv (2006) Fork-Coupled Resonators for High Frequency Characterization of Dielectric Substrate Materials. IEEE Transactions on Instrumentation and Measurements, 55 (6). pp. 2216-2220.
language_invalid_str_mv en
network_acronym_str KFUPM
network_name_str King Fahd University of Petroleum and Minerals
oai_identifier_str oai::1224
publishDate 2006
repository.mail.fl_str_mv
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spelling Fork-Coupled Resonators for High Frequency Characterization of Dielectric Substrate MaterialsMuqaibel, A.Safaai-Jazi, A.Riad, S.unknownElectricalAbstract—Efficient coupling of energy in and out of a resonator can significantly enhance its performance, particularly when used for dielectric characterization of materials. In this paper, a new microstrip resonator is introduced, which uses fork-shaped feed elements for improving the coupling efficiency. The proposed resonator is studied both experimentally and theoretically with field simulation software. An important advantage of the fork microstrip resonator is attributed to its single-layer geometry and easier manufacturing processes. This resonator is used to characterize three different dielectric materials. Comparison of measurement results from the fork resonator with those obtained with a stripline resonator suggests that the proposed resonator offers a superior performance.2006-122020ArticlePeerReviewedinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttps://eprints.kfupm.edu.sa/id/eprint/1224/1/ddd.pdf (2006) Fork-Coupled Resonators for High Frequency Characterization of Dielectric Substrate Materials. IEEE Transactions on Instrumentation and Measurements, 55 (6). pp. 2216-2220. enhttps://eprints.kfupm.edu.sa/id/eprint/1224/info:eu-repo/semantics/openAccessoai::12242019-11-01T13:26:28Z
spellingShingle Fork-Coupled Resonators for High Frequency Characterization of Dielectric Substrate Materials
Muqaibel, A.
Electrical
status_str publishedVersion
title Fork-Coupled Resonators for High Frequency Characterization of Dielectric Substrate Materials
title_full Fork-Coupled Resonators for High Frequency Characterization of Dielectric Substrate Materials
title_fullStr Fork-Coupled Resonators for High Frequency Characterization of Dielectric Substrate Materials
title_full_unstemmed Fork-Coupled Resonators for High Frequency Characterization of Dielectric Substrate Materials
title_short Fork-Coupled Resonators for High Frequency Characterization of Dielectric Substrate Materials
title_sort Fork-Coupled Resonators for High Frequency Characterization of Dielectric Substrate Materials
topic Electrical
url https://eprints.kfupm.edu.sa/id/eprint/1224/1/ddd.pdf