A hybrid test compression technique for efficient testing of systems-on-a-chip

One of the major challenges in testing a System-on-a-Chip (SOC) is dealing with the large test data size. To reduce the volume of test data, several efficient test data compression techniques have been recently proposed. In this paper, we propose hybrid test compression techniques that combine the G...

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Main Author: El-Maleh, A.H. (author)
Other Authors: unknown (author)
Format: article
Published: 2003
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Online Access:https://eprints.kfupm.edu.sa/id/eprint/14440/1/14440_1.pdf
https://eprints.kfupm.edu.sa/id/eprint/14440/2/14440_2.doc
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author El-Maleh, A.H.
author2 unknown
author2_role author
author_facet El-Maleh, A.H.
unknown
author_role author
dc.creator.none.fl_str_mv El-Maleh, A.H.
unknown
dc.date.none.fl_str_mv 2003-12
2020
dc.format.none.fl_str_mv application/pdf
application/msword
dc.identifier.none.fl_str_mv https://eprints.kfupm.edu.sa/id/eprint/14440/1/14440_1.pdf
https://eprints.kfupm.edu.sa/id/eprint/14440/2/14440_2.doc
(2003) A hybrid test compression technique for efficient testing of systems-on-a-chip. Electronics, Circuits and Systems, 2003. ICECS 2003. Proceedings of the 2003 10th IEEE International conference, 2.
dc.language.none.fl_str_mv en
en
dc.publisher.none.fl_str_mv IEEE
dc.relation.none.fl_str_mv https://eprints.kfupm.edu.sa/id/eprint/14440/
dc.rights.*.fl_str_mv info:eu-repo/semantics/openAccess
dc.subject.none.fl_str_mv Computer
dc.title.none.fl_str_mv A hybrid test compression technique for efficient testing of systems-on-a-chip
dc.type.none.fl_str_mv Article
PeerReviewed
info:eu-repo/semantics/publishedVersion
info:eu-repo/semantics/article
description One of the major challenges in testing a System-on-a-Chip (SOC) is dealing with the large test data size. To reduce the volume of test data, several efficient test data compression techniques have been recently proposed. In this paper, we propose hybrid test compression techniques that combine the Geometric-Primitives-Based compression technique with the frequency-directed run-length (FDR) and extended frequency-directed run-length (EFDR) coding techniques. Based on experimental results, we demonstrate the effectiveness of the proposed hybrid compression techniques in increasing the test data compression ratios over those obtained by the Geometric-Primitives-Based compression technique.
eu_rights_str_mv openAccess
format article
id KFUPM_986fce1a3388ec5cce54d26b9fd91d5d
identifier_str_mv (2003) A hybrid test compression technique for efficient testing of systems-on-a-chip. Electronics, Circuits and Systems, 2003. ICECS 2003. Proceedings of the 2003 10th IEEE International conference, 2.
language_invalid_str_mv en
network_acronym_str KFUPM
network_name_str King Fahd University of Petroleum and Minerals
oai_identifier_str oai::14440
publishDate 2003
publisher.none.fl_str_mv IEEE
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spelling A hybrid test compression technique for efficient testing of systems-on-a-chipEl-Maleh, A.H.unknownComputerOne of the major challenges in testing a System-on-a-Chip (SOC) is dealing with the large test data size. To reduce the volume of test data, several efficient test data compression techniques have been recently proposed. In this paper, we propose hybrid test compression techniques that combine the Geometric-Primitives-Based compression technique with the frequency-directed run-length (FDR) and extended frequency-directed run-length (EFDR) coding techniques. Based on experimental results, we demonstrate the effectiveness of the proposed hybrid compression techniques in increasing the test data compression ratios over those obtained by the Geometric-Primitives-Based compression technique.IEEE2003-122020ArticlePeerReviewedinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfapplication/mswordhttps://eprints.kfupm.edu.sa/id/eprint/14440/1/14440_1.pdfhttps://eprints.kfupm.edu.sa/id/eprint/14440/2/14440_2.doc (2003) A hybrid test compression technique for efficient testing of systems-on-a-chip. Electronics, Circuits and Systems, 2003. ICECS 2003. Proceedings of the 2003 10th IEEE International conference, 2. enenhttps://eprints.kfupm.edu.sa/id/eprint/14440/info:eu-repo/semantics/openAccessoai::144402019-11-01T14:05:49Z
spellingShingle A hybrid test compression technique for efficient testing of systems-on-a-chip
El-Maleh, A.H.
Computer
status_str publishedVersion
title A hybrid test compression technique for efficient testing of systems-on-a-chip
title_full A hybrid test compression technique for efficient testing of systems-on-a-chip
title_fullStr A hybrid test compression technique for efficient testing of systems-on-a-chip
title_full_unstemmed A hybrid test compression technique for efficient testing of systems-on-a-chip
title_short A hybrid test compression technique for efficient testing of systems-on-a-chip
title_sort A hybrid test compression technique for efficient testing of systems-on-a-chip
topic Computer
url https://eprints.kfupm.edu.sa/id/eprint/14440/1/14440_1.pdf
https://eprints.kfupm.edu.sa/id/eprint/14440/2/14440_2.doc