An Efficient Test Vector Compression Technique Based on Geometric Shapes

One of the prime challenges of testing a system-on-a-chip (SOC) is to reduce the required test data size. In this paper, we introduce a novel compression / decompression scheme based on geometric shapes that substantially reduces the amount of test data and reduces test time. The proposed scheme is...

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محفوظ في:
التفاصيل البيبلوغرافية
المؤلف الرئيسي: Al Zahir, Saif (author)
مؤلفون آخرون: El-Maleh, Aiman H. (author), Khan, Esam (author), unknown (author)
التنسيق: article
منشور في: 2001
الموضوعات:
الوصول للمادة أونلاين:https://eprints.kfupm.edu.sa/id/eprint/149/1/An_Efficient_Test_Vector_Compression_Technique_Based_on_Geometric_Shapes_icecs2001.pdf
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author Al Zahir, Saif
author2 El-Maleh, Aiman H.
Khan, Esam
unknown
author2_role author
author
author
author_facet Al Zahir, Saif
El-Maleh, Aiman H.
Khan, Esam
unknown
author_role author
dc.creator.none.fl_str_mv Al Zahir, Saif
El-Maleh, Aiman H.
Khan, Esam
unknown
dc.date.none.fl_str_mv 2001
2020
dc.format.none.fl_str_mv application/pdf
dc.identifier.none.fl_str_mv https://eprints.kfupm.edu.sa/id/eprint/149/1/An_Efficient_Test_Vector_Compression_Technique_Based_on_Geometric_Shapes_icecs2001.pdf
(2001) An Efficient Test Vector Compression Technique Based on Geometric Shapes. 8th IEEE International Conference on Electronics, Circuits and Systems. pp. 1561-1564.
dc.language.none.fl_str_mv en
dc.relation.none.fl_str_mv https://eprints.kfupm.edu.sa/id/eprint/149/
dc.rights.*.fl_str_mv info:eu-repo/semantics/openAccess
dc.subject.none.fl_str_mv Computer
dc.title.none.fl_str_mv An Efficient Test Vector Compression Technique Based on Geometric Shapes
dc.type.none.fl_str_mv Article
PeerReviewed
info:eu-repo/semantics/publishedVersion
info:eu-repo/semantics/article
description One of the prime challenges of testing a system-on-a-chip (SOC) is to reduce the required test data size. In this paper, we introduce a novel compression / decompression scheme based on geometric shapes that substantially reduces the amount of test data and reduces test time. The proposed scheme is based on ordering the test vectors in such a way that enables the generation of geometric shapes that can be highly compressed via perfect lossless compression. Experimental results on ISCAS benchmark circuits demonstrate the effectiveness of the proposed technique in achieving very high compression ratio. Compared to published results, our technique achieves significantly higher compression ratio.
eu_rights_str_mv openAccess
format article
id KFUPM_d981f8feec5005575e8f70f0322e8267
identifier_str_mv (2001) An Efficient Test Vector Compression Technique Based on Geometric Shapes. 8th IEEE International Conference on Electronics, Circuits and Systems. pp. 1561-1564.
language_invalid_str_mv en
network_acronym_str KFUPM
network_name_str King Fahd University of Petroleum and Minerals
oai_identifier_str oai::149
publishDate 2001
repository.mail.fl_str_mv
repository.name.fl_str_mv
repository_id_str
spelling An Efficient Test Vector Compression Technique Based on Geometric ShapesAl Zahir, SaifEl-Maleh, Aiman H.Khan, EsamunknownComputerOne of the prime challenges of testing a system-on-a-chip (SOC) is to reduce the required test data size. In this paper, we introduce a novel compression / decompression scheme based on geometric shapes that substantially reduces the amount of test data and reduces test time. The proposed scheme is based on ordering the test vectors in such a way that enables the generation of geometric shapes that can be highly compressed via perfect lossless compression. Experimental results on ISCAS benchmark circuits demonstrate the effectiveness of the proposed technique in achieving very high compression ratio. Compared to published results, our technique achieves significantly higher compression ratio.20012020ArticlePeerReviewedinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttps://eprints.kfupm.edu.sa/id/eprint/149/1/An_Efficient_Test_Vector_Compression_Technique_Based_on_Geometric_Shapes_icecs2001.pdf (2001) An Efficient Test Vector Compression Technique Based on Geometric Shapes. 8th IEEE International Conference on Electronics, Circuits and Systems. pp. 1561-1564. enhttps://eprints.kfupm.edu.sa/id/eprint/149/info:eu-repo/semantics/openAccessoai::1492019-11-01T13:22:36Z
spellingShingle An Efficient Test Vector Compression Technique Based on Geometric Shapes
Al Zahir, Saif
Computer
status_str publishedVersion
title An Efficient Test Vector Compression Technique Based on Geometric Shapes
title_full An Efficient Test Vector Compression Technique Based on Geometric Shapes
title_fullStr An Efficient Test Vector Compression Technique Based on Geometric Shapes
title_full_unstemmed An Efficient Test Vector Compression Technique Based on Geometric Shapes
title_short An Efficient Test Vector Compression Technique Based on Geometric Shapes
title_sort An Efficient Test Vector Compression Technique Based on Geometric Shapes
topic Computer
url https://eprints.kfupm.edu.sa/id/eprint/149/1/An_Efficient_Test_Vector_Compression_Technique_Based_on_Geometric_Shapes_icecs2001.pdf