Using a new patent based technology indicator to measure the paceof technological progress for superconductor and semiconductortechnologies
This study used the technology cycle time indicator (TCT) to measure the pace of technological progress in superconductor and semiconductor technologies, then to demonstrate its validity, compared it with the real cycles of technological progress described by the technology experts. The study also u...
محفوظ في:
| المؤلف الرئيسي: | |
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| مؤلفون آخرون: | |
| التنسيق: | article |
| منشور في: |
1997
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| الموضوعات: | |
| الوصول للمادة أونلاين: | https://eprints.kfupm.edu.sa/id/eprint/14091/1/14091_1.pdf https://eprints.kfupm.edu.sa/id/eprint/14091/2/14091_2.doc |
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| _version_ | 1864513393342283776 |
|---|---|
| author | Kayal, A. |
| author2 | unknown |
| author2_role | author |
| author_facet | Kayal, A. unknown |
| author_role | author |
| dc.creator.none.fl_str_mv | Kayal, A. unknown |
| dc.date.none.fl_str_mv | 1997-07 2020 |
| dc.format.none.fl_str_mv | application/pdf application/msword |
| dc.identifier.none.fl_str_mv | https://eprints.kfupm.edu.sa/id/eprint/14091/1/14091_1.pdf https://eprints.kfupm.edu.sa/id/eprint/14091/2/14091_2.doc (1997) Using a new patent based technology indicator to measure the paceof technological progress for superconductor and semiconductortechnologies. Innovation in Technology Management - The Key to Global Leadership. PICMET '97: Portland International conference Management and Technology, 1. |
| dc.language.none.fl_str_mv | en en |
| dc.publisher.none.fl_str_mv | IEEE |
| dc.relation.none.fl_str_mv | https://eprints.kfupm.edu.sa/id/eprint/14091/ |
| dc.rights.*.fl_str_mv | info:eu-repo/semantics/openAccess |
| dc.subject.none.fl_str_mv | Computer |
| dc.title.none.fl_str_mv | Using a new patent based technology indicator to measure the paceof technological progress for superconductor and semiconductortechnologies |
| dc.type.none.fl_str_mv | Article PeerReviewed info:eu-repo/semantics/publishedVersion info:eu-repo/semantics/article |
| description | This study used the technology cycle time indicator (TCT) to measure the pace of technological progress in superconductor and semiconductor technologies, then to demonstrate its validity, compared it with the real cycles of technological progress described by the technology experts. The study also used the TCT to assess the positions of various countries patenting in the semiconductor technology field, then checked how the TCT assessment corresponded with the experts' assessments. The findings revealed that the TCT provided good assessment in each situation |
| eu_rights_str_mv | openAccess |
| format | article |
| id | KFUPM_f58acb6aab3733dcc63537c163fe56a5 |
| identifier_str_mv | (1997) Using a new patent based technology indicator to measure the paceof technological progress for superconductor and semiconductortechnologies. Innovation in Technology Management - The Key to Global Leadership. PICMET '97: Portland International conference Management and Technology, 1. |
| language_invalid_str_mv | en |
| network_acronym_str | KFUPM |
| network_name_str | King Fahd University of Petroleum and Minerals |
| oai_identifier_str | oai::14091 |
| publishDate | 1997 |
| publisher.none.fl_str_mv | IEEE |
| repository.mail.fl_str_mv | |
| repository.name.fl_str_mv | |
| repository_id_str | |
| spelling | Using a new patent based technology indicator to measure the paceof technological progress for superconductor and semiconductortechnologiesKayal, A.unknownComputerThis study used the technology cycle time indicator (TCT) to measure the pace of technological progress in superconductor and semiconductor technologies, then to demonstrate its validity, compared it with the real cycles of technological progress described by the technology experts. The study also used the TCT to assess the positions of various countries patenting in the semiconductor technology field, then checked how the TCT assessment corresponded with the experts' assessments. The findings revealed that the TCT provided good assessment in each situationIEEE1997-072020ArticlePeerReviewedinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfapplication/mswordhttps://eprints.kfupm.edu.sa/id/eprint/14091/1/14091_1.pdfhttps://eprints.kfupm.edu.sa/id/eprint/14091/2/14091_2.doc (1997) Using a new patent based technology indicator to measure the paceof technological progress for superconductor and semiconductortechnologies. Innovation in Technology Management - The Key to Global Leadership. PICMET '97: Portland International conference Management and Technology, 1. enenhttps://eprints.kfupm.edu.sa/id/eprint/14091/info:eu-repo/semantics/openAccessoai::140912019-11-01T14:04:07Z |
| spellingShingle | Using a new patent based technology indicator to measure the paceof technological progress for superconductor and semiconductortechnologies Kayal, A. Computer |
| status_str | publishedVersion |
| title | Using a new patent based technology indicator to measure the paceof technological progress for superconductor and semiconductortechnologies |
| title_full | Using a new patent based technology indicator to measure the paceof technological progress for superconductor and semiconductortechnologies |
| title_fullStr | Using a new patent based technology indicator to measure the paceof technological progress for superconductor and semiconductortechnologies |
| title_full_unstemmed | Using a new patent based technology indicator to measure the paceof technological progress for superconductor and semiconductortechnologies |
| title_short | Using a new patent based technology indicator to measure the paceof technological progress for superconductor and semiconductortechnologies |
| title_sort | Using a new patent based technology indicator to measure the paceof technological progress for superconductor and semiconductortechnologies |
| topic | Computer |
| url | https://eprints.kfupm.edu.sa/id/eprint/14091/1/14091_1.pdf https://eprints.kfupm.edu.sa/id/eprint/14091/2/14091_2.doc |