Estimating test cost during data path and controller synthesis with low power overhead
This paper presents a method for concurrent BIST cost estimation during testable data path allocation. The method integrates testability in the design process and generates a distributed test controller that aims to minimize area and power. The system has been implemented and favorable results are r...
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| Format: | conferenceObject |
| Published: |
2017
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| Online Access: | http://hdl.handle.net/10725/5452 http://dx.doi.org/10.1109/CCECE.2010.5575139 http://libraries.lau.edu.lb/research/laur/terms-of-use/articles.php http://ieeexplore.ieee.org/abstract/document/5575139/ |
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