An incremental approach for test scheduling and synthesis using genetic algorithms

This paper presents a new and an efficient method for concurrent BIST synthesis and test scheduling. This method maximizes concurrent testing of modules while performing the allocation of functional units, test registers, and multiplexers. The method is based on a genetic algorithm that efficiently...

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Bibliographic Details
Main Author: Harmanani, H. (author)
Other Authors: Hajar, A. (author)
Format: conferenceObject
Published: 2017
Online Access:http://hdl.handle.net/10725/5442
http://dx.doi.org/10.1109/NEWCAS.2004.1359019
http://libraries.lau.edu.lb/research/laur/terms-of-use/articles.php
http://ieeexplore.ieee.org/abstract/document/1359019/
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Summary:This paper presents a new and an efficient method for concurrent BIST synthesis and test scheduling. This method maximizes concurrent testing of modules while performing the allocation of functional units, test registers, and multiplexers. The method is based on a genetic algorithm that efficiently explores the testable design space. The method was implemented using C++ on a Linux workstation. Several benchmark examples have been implemented and favorable results are reported.