An incremental approach for test scheduling and synthesis using genetic algorithms
This paper presents a new and an efficient method for concurrent BIST synthesis and test scheduling. This method maximizes concurrent testing of modules while performing the allocation of functional units, test registers, and multiplexers. The method is based on a genetic algorithm that efficiently...
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| Format: | conferenceObject |
| Published: |
2017
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| Online Access: | http://hdl.handle.net/10725/5442 http://dx.doi.org/10.1109/NEWCAS.2004.1359019 http://libraries.lau.edu.lb/research/laur/terms-of-use/articles.php http://ieeexplore.ieee.org/abstract/document/1359019/ |
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| Summary: | This paper presents a new and an efficient method for concurrent BIST synthesis and test scheduling. This method maximizes concurrent testing of modules while performing the allocation of functional units, test registers, and multiplexers. The method is based on a genetic algorithm that efficiently explores the testable design space. The method was implemented using C++ on a Linux workstation. Several benchmark examples have been implemented and favorable results are reported. |
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