An estimation on the mechanical stabilities of SAMs by low energy Ar+ cluster ion collision

An estimation on the mechanical stabilities of SAMs by low energy Ar+ cluster ion collision

<p dir="ltr">The stability of the molecular self-assembled monolayers (SAMs) is of vital importance to the performance of the molecular electronics and their integration to the future electronics devices. Here we study the effect of electron irradiation-induced cross-linking on the s...

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Bibliographic Details
Main Author: Y. Tong (18394389) (author)
Other Authors: G. R. Berdiyorov (4435975) (author), A. Sinopoli (18527781) (author), M. E. Madjet (2361730) (author), V. A. Esaulov (18527784) (author), H. Hamoudi (14151123) (author)
Published: 2021
Subjects:
Engineering
Materials engineering
Nanotechnology
Self-assembled monolayers (SAMs)
Molecular electronics
Electron irradiation
Cross-linking
Stability
Mechanical stability
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