Supplement Number 1

Supplement for the electric field distribution under operating conditions influence the effect or distribution of these defects

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Bibliographic Details
Main Author:	Xueqiang Yu (21626324) (author)
Other Authors:	Xiaodong Xu (276342) (author), Hao Jiang (95017) (author), Lei Wu (202933) (author), Fengkai Liu (12727795) (author), Weiqi Li (419558) (author), Zhongli Liu (2208724) (author), Hongbin Geng (21626327) (author), Jianqun Yang (9022643) (author), Xingji Li (9022640) (author)
Published:	2025
Subjects:	Engineering Electric field on defect formation in 4H-SiC
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