Unit cell distribution of the indexed HEWL images processed by

<p><b>(A)</b><b>MOSFLM,</b><b>(B)</b><b>DirAx, and</b><b>(C)</b><b>XGANDALF at various input CTDDs.</b> The histogram shows the distribution of unit cell parameters (a, b, c, α, β, and γ) extracted from indexed diffraction...

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Main Author: Ki Hyun Nam (5813819) (author)
Published: 2025
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Summary:<p><b>(A)</b><b>MOSFLM,</b><b>(B)</b><b>DirAx, and</b><b>(C)</b><b>XGANDALF at various input CTDDs.</b> The histogram shows the distribution of unit cell parameters (a, b, c, α, β, and γ) extracted from indexed diffraction patterns. At a CTDD of 298 mm, which is close to the actual CTDD value, the unit cell parameters exhibit a clear Gaussian distribution. In contrast, CTDD values of 292 mm and 304 mm, which deviate from the actual value, result in distorted Gaussian distributions of the unit cell parameters.</p>