Supplementary Material

Experimental details, characterization of Li6.4Ga0.2La3Zr1.75Ta0.25O12 under ambient conditions, equivalent circuit, Raman spectra at selected pressures and pressure variation of Raman mode frequencies, high-resolution transmission electron microscopy images of Ga/Ta-LLZO quenched from different pre...

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Bibliographic Details
Main Author: Jialiang Jiang (11031162) (author)
Other Authors: Qinglin Wang (2016430) (author), Jie Cui (198388) (author), Huiyuan Guo (115473) (author), Haiwa Zhang (8191068) (author), Guozhao Zhang (8191065) (author), Xingtao Chen (20401538) (author), Yue Jiang (102705) (author), Yinwei Li (1390687) (author), Cailong Liu (588287) (author)
Published: 2025
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Summary:Experimental details, characterization of Li6.4Ga0.2La3Zr1.75Ta0.25O12 under ambient conditions, equivalent circuit, Raman spectra at selected pressures and pressure variation of Raman mode frequencies, high-resolution transmission electron microscopy images of Ga/Ta-LLZO quenched from different pressures and detailed fitting parameters