Supplementary Figures S1-S17, and Table 1
Growth rate monitoring (Fig. S1), AFM and XRD characterizations of thin films (Figs. S2 and S3), characterization of the upper and lower interfaces of the device (Fig. S4), Statistical analysis of Ni nanocolumn size (Fig. S5), Set and Reset operations (Fig. S6), LRS and HRS testing (Fig. S7), multip...
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| Glavni avtor: | |
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| Drugi avtorji: | , , , , , , , , , , , , , |
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2025
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