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1
Empirical comparison of regression test selection algorithms
Published 2001“…In the maintenance phase, the regression test selection problem refers to selecting test cases from the initial suite of test cases used in the development phase. …”
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Security testing and evaluation of cryptography algorithms. (c2003)
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3
A method for test scheduling using an evolutionary approach. (c2000)
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4
Test case generation for path coverage. (c2000)
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Metaheuristic algorithm for testing web 2.0 applications. (c2012)
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Simulated annealing and improved genetic algorithms for path testing. (c1997)
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7
Test Vector Decomposition Based Static Compaction Algorithms for Combinational Circuits
Published 2003“…In this paper, a new approach to static compaction for combinational circuits, referred to as test vector decomposition (TVD), is proposed. …”
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Testing and evaluating digital signature algorithms in principal ideal domains. (c2005)
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A genetic algorithm for corrective retesting. (c1995)
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Salp swarm algorithm: survey, analysis, and new applications
Published 2024“…The behavior of the species when traveling and foraging in the waters is the main source of SSA and MSSA. These two algorithms are put to test on a variety of mathematical optimization functions to see how they behave when it comes to finding the best solutions to optimization problems. …”
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Optimization metaheuristic for software testing
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Software tool for regression testing. (c1997)
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A comparative study of regression testing methods. (c1996)
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Methods for system-on-chip test design, scheduling and optimization. (c2006)
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17
Incremental & classical genetic algorithm. (c2001)
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18
A pragmatic approach for testing robustness on real-time component based systems
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A novel linear time corner detection algorithm
Published 2005“…This scheme works for both, smooth planner and irregular planner shapes. Test results of this algorithm are compared with some commonly referred corner detectors. …”
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A static test compaction technique for combinational circuits based on independent fault clustering
Published 2003“…The algorithm is referred to as independent fault clustering. …”
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