Showing 1 - 20 results of 60 for search '(((( elements testing algorithm ) OR ( complement _ algorithm ))) OR ( neural coding algorithm ))', query time: 0.13s Refine Results
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    Evolutionary algorithms for state justification in sequential automatic test pattern generation by El-Maleh, Aiman H.

    Published 2005
    “…Sequential circuit test generation using deterministic, fault-oriented algorithms is highly complex and time consuming. …”
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    On the Optimization of Band Gaps in Periodic Waveguides by Jamil Renno (14070771)

    Published 2025
    “…<h3 dir="ltr">Purpose</h3><p dir="ltr">This work applies a computational framework for vibration attenuation in periodic structures by combining the established wave and finite element (WFE) method with nature-inspired optimization algorithms. …”
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    Design of adaptive arrays based on element position perturbations by Dawoud, M.M.

    Published 1993
    “…The proposed adaptive system is used to form automatically the required nulls in the direction of arrival of the interference. The design has been tested on arrays of three, five and eight elements. …”
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    Test bus assignment, sizing, and partitioning for system-on-chip by Harmanani, Haidar M.

    Published 2007
    “…The test access mechanism (TAM) is an important element of test architectures for embedded cores and is responsible for on-chip test pattern transport from the source to the core under test to the sink. …”
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    Adaptive bias simulated evolution algorithm for placement by Youssef, H.

    Published 2001
    “…A new solution is evolved from current solution by relocating some of the solution elements. Elements with lower goodnesses have higher probabilities of getting selected for perturbation. …”
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    article
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    An Evolutionary Meta-Heuristic for State Justification in Sequential Automatic Test Pattern Generation by El-Maleh, Aiman H.

    Published 2001
    “…Sequential circuit test generation using deterministic, fault-oriented algorithms is highly complex and time consuming. …”
    Get full text
    article
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    An evolutionary meta-heuristic for state justification insequential automatic test pattern generation by El-Maleh, A.H.

    Published 2001
    “…Sequential circuit test generation using deterministic, fault-oriented algorithms is highly complex and time consuming. …”
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    article
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    A method for optimizing test bus assignment and sizing for system-on-a-chip by Harmanani, Haidar M.

    Published 2017
    “…Test access mechanism (TAM) is an important element of test access architectures for embedded cores and is responsible for on-chip test patterns transport from the source to the core under test to the sink. …”
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    Fuzzy simulated evolution algorithm for topology design of campusnetworks by Youssef, H.

    Published 2000
    “…Results show that on all test cases the simulated evolution algorithm exhibits more intelligent search of the solution subspace and was able to find better solutions than simulated annealing…”
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    Block constrained pressure residual preconditioning for two-phase flow in porous media by mixed hybrid finite elements by Stefano Nardean (14151900)

    Published 2023
    “…Therefore, we designed a dedicated two-stage strategy, inspired by the CPR algorithm, where a block preconditioner is used for the pressure part with the aim at exploiting the inner $$2\times 2$$ 2 × 2 structure. …”
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