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testing algorithm » cosine algorithm (Expand Search)
coding algorithm » cosine algorithm (Expand Search), colony algorithm (Expand Search), scheduling algorithm (Expand Search)
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Evolutionary algorithms for state justification in sequential automatic test pattern generation
Published 2005“…Sequential circuit test generation using deterministic, fault-oriented algorithms is highly complex and time consuming. …”
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CNN and HEVC Video Coding Features for Static Video Summarization
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On the Optimization of Band Gaps in Periodic Waveguides
Published 2025“…<h3 dir="ltr">Purpose</h3><p dir="ltr">This work applies a computational framework for vibration attenuation in periodic structures by combining the established wave and finite element (WFE) method with nature-inspired optimization algorithms. …”
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Design of adaptive arrays based on element position perturbations
Published 1993“…The proposed adaptive system is used to form automatically the required nulls in the direction of arrival of the interference. The design has been tested on arrays of three, five and eight elements. …”
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Automatic Video Summarization Using HEVC and CNN Features
Published 2022Get full text
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Test bus assignment, sizing, and partitioning for system-on-chip
Published 2007“…The test access mechanism (TAM) is an important element of test architectures for embedded cores and is responsible for on-chip test pattern transport from the source to the core under test to the sink. …”
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Adaptive bias simulated evolution algorithm for placement
Published 2001“…A new solution is evolved from current solution by relocating some of the solution elements. Elements with lower goodnesses have higher probabilities of getting selected for perturbation. …”
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An Evolutionary Meta-Heuristic for State Justification in Sequential Automatic Test Pattern Generation
Published 2001“…Sequential circuit test generation using deterministic, fault-oriented algorithms is highly complex and time consuming. …”
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An evolutionary meta-heuristic for state justification insequential automatic test pattern generation
Published 2001“…Sequential circuit test generation using deterministic, fault-oriented algorithms is highly complex and time consuming. …”
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A method for optimizing test bus assignment and sizing for system-on-a-chip
Published 2017“…Test access mechanism (TAM) is an important element of test access architectures for embedded cores and is responsible for on-chip test patterns transport from the source to the core under test to the sink. …”
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Fuzzy simulated evolution algorithm for topology design of campusnetworks
Published 2000“…Results show that on all test cases the simulated evolution algorithm exhibits more intelligent search of the solution subspace and was able to find better solutions than simulated annealing…”
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Block constrained pressure residual preconditioning for two-phase flow in porous media by mixed hybrid finite elements
Published 2023“…Therefore, we designed a dedicated two-stage strategy, inspired by the CPR algorithm, where a block preconditioner is used for the pressure part with the aim at exploiting the inner $$2\times 2$$ 2 × 2 structure. …”
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Intelligent Rapidly-Exploring Random Tree Star Algorithm
Published 2024Get full text
doctoralThesis