Showing 20,221 - 20,240 results of 135,713 for search '(( 2 we decrease ) OR ( 5 ((point decrease) OR (((mean decrease) OR (a decrease)))) ))', query time: 2.13s Refine Results
  1. 20221
  2. 20222

    Modeling Inter-trial Variability of Saccade Trajectories: Effects of Lesions of the Oculomotor Part of the Fastigial Nucleus by Thomas Eggert (496903)

    Published 2016
    “…<div><p>This study investigates the inter-trial variability of saccade trajectories observed in five rhesus macaques (Macaca mulatta). For each time point during a saccade, the inter-trial variance of eye position and its covariance with eye end position were evaluated. …”
  3. 20223

    Nanoscale Adhesion and Material Transfer at 2D MoS<sub>2</sub>–MoS<sub>2</sub> Interfaces Elucidated by In Situ Transmission Electron Microscopy and Atomistic Simulations by Sathwik Reddy Toom (18625103)

    Published 2024
    “…The implementation of such devices requires an understanding of adhesive phenomena at the interfaces between these materials. Here, we describe combined nanoscale <i>in situ</i> transmission electron microscopy (TEM)/atomic force microscopy (AFM) experiments and simulations measuring the work of adhesion (<i>W</i><sub>adh</sub>) between self-mated contacts of ultrathin nominally amorphous and nanocrystalline MoS<sub>2</sub> films deposited on Si scanning probe tips. …”
  4. 20224

    Nanoscale Adhesion and Material Transfer at 2D MoS<sub>2</sub>–MoS<sub>2</sub> Interfaces Elucidated by In Situ Transmission Electron Microscopy and Atomistic Simulations by Sathwik Reddy Toom (18625103)

    Published 2024
    “…The implementation of such devices requires an understanding of adhesive phenomena at the interfaces between these materials. Here, we describe combined nanoscale <i>in situ</i> transmission electron microscopy (TEM)/atomic force microscopy (AFM) experiments and simulations measuring the work of adhesion (<i>W</i><sub>adh</sub>) between self-mated contacts of ultrathin nominally amorphous and nanocrystalline MoS<sub>2</sub> films deposited on Si scanning probe tips. …”
  5. 20225

    Nanoscale Adhesion and Material Transfer at 2D MoS<sub>2</sub>–MoS<sub>2</sub> Interfaces Elucidated by In Situ Transmission Electron Microscopy and Atomistic Simulations by Sathwik Reddy Toom (18625103)

    Published 2024
    “…The implementation of such devices requires an understanding of adhesive phenomena at the interfaces between these materials. Here, we describe combined nanoscale <i>in situ</i> transmission electron microscopy (TEM)/atomic force microscopy (AFM) experiments and simulations measuring the work of adhesion (<i>W</i><sub>adh</sub>) between self-mated contacts of ultrathin nominally amorphous and nanocrystalline MoS<sub>2</sub> films deposited on Si scanning probe tips. …”
  6. 20226

    Nanoscale Adhesion and Material Transfer at 2D MoS<sub>2</sub>–MoS<sub>2</sub> Interfaces Elucidated by In Situ Transmission Electron Microscopy and Atomistic Simulations by Sathwik Reddy Toom (18625103)

    Published 2024
    “…The implementation of such devices requires an understanding of adhesive phenomena at the interfaces between these materials. Here, we describe combined nanoscale <i>in situ</i> transmission electron microscopy (TEM)/atomic force microscopy (AFM) experiments and simulations measuring the work of adhesion (<i>W</i><sub>adh</sub>) between self-mated contacts of ultrathin nominally amorphous and nanocrystalline MoS<sub>2</sub> films deposited on Si scanning probe tips. …”
  7. 20227

    Nanoscale Adhesion and Material Transfer at 2D MoS<sub>2</sub>–MoS<sub>2</sub> Interfaces Elucidated by In Situ Transmission Electron Microscopy and Atomistic Simulations by Sathwik Reddy Toom (18625103)

    Published 2024
    “…The implementation of such devices requires an understanding of adhesive phenomena at the interfaces between these materials. Here, we describe combined nanoscale <i>in situ</i> transmission electron microscopy (TEM)/atomic force microscopy (AFM) experiments and simulations measuring the work of adhesion (<i>W</i><sub>adh</sub>) between self-mated contacts of ultrathin nominally amorphous and nanocrystalline MoS<sub>2</sub> films deposited on Si scanning probe tips. …”
  8. 20228

    Nanoscale Adhesion and Material Transfer at 2D MoS<sub>2</sub>–MoS<sub>2</sub> Interfaces Elucidated by In Situ Transmission Electron Microscopy and Atomistic Simulations by Sathwik Reddy Toom (18625103)

    Published 2024
    “…The implementation of such devices requires an understanding of adhesive phenomena at the interfaces between these materials. Here, we describe combined nanoscale <i>in situ</i> transmission electron microscopy (TEM)/atomic force microscopy (AFM) experiments and simulations measuring the work of adhesion (<i>W</i><sub>adh</sub>) between self-mated contacts of ultrathin nominally amorphous and nanocrystalline MoS<sub>2</sub> films deposited on Si scanning probe tips. …”
  9. 20229

    Nanoscale Adhesion and Material Transfer at 2D MoS<sub>2</sub>–MoS<sub>2</sub> Interfaces Elucidated by In Situ Transmission Electron Microscopy and Atomistic Simulations by Sathwik Reddy Toom (18625103)

    Published 2024
    “…The implementation of such devices requires an understanding of adhesive phenomena at the interfaces between these materials. Here, we describe combined nanoscale <i>in situ</i> transmission electron microscopy (TEM)/atomic force microscopy (AFM) experiments and simulations measuring the work of adhesion (<i>W</i><sub>adh</sub>) between self-mated contacts of ultrathin nominally amorphous and nanocrystalline MoS<sub>2</sub> films deposited on Si scanning probe tips. …”
  10. 20230

    Nanoscale Adhesion and Material Transfer at 2D MoS<sub>2</sub>–MoS<sub>2</sub> Interfaces Elucidated by In Situ Transmission Electron Microscopy and Atomistic Simulations by Sathwik Reddy Toom (18625103)

    Published 2024
    “…The implementation of such devices requires an understanding of adhesive phenomena at the interfaces between these materials. Here, we describe combined nanoscale <i>in situ</i> transmission electron microscopy (TEM)/atomic force microscopy (AFM) experiments and simulations measuring the work of adhesion (<i>W</i><sub>adh</sub>) between self-mated contacts of ultrathin nominally amorphous and nanocrystalline MoS<sub>2</sub> films deposited on Si scanning probe tips. …”
  11. 20231

    Nanoscale Adhesion and Material Transfer at 2D MoS<sub>2</sub>–MoS<sub>2</sub> Interfaces Elucidated by In Situ Transmission Electron Microscopy and Atomistic Simulations by Sathwik Reddy Toom (18625103)

    Published 2024
    “…The implementation of such devices requires an understanding of adhesive phenomena at the interfaces between these materials. Here, we describe combined nanoscale <i>in situ</i> transmission electron microscopy (TEM)/atomic force microscopy (AFM) experiments and simulations measuring the work of adhesion (<i>W</i><sub>adh</sub>) between self-mated contacts of ultrathin nominally amorphous and nanocrystalline MoS<sub>2</sub> films deposited on Si scanning probe tips. …”
  12. 20232

    Nanoscale Adhesion and Material Transfer at 2D MoS<sub>2</sub>–MoS<sub>2</sub> Interfaces Elucidated by In Situ Transmission Electron Microscopy and Atomistic Simulations by Sathwik Reddy Toom (18625103)

    Published 2024
    “…The implementation of such devices requires an understanding of adhesive phenomena at the interfaces between these materials. Here, we describe combined nanoscale <i>in situ</i> transmission electron microscopy (TEM)/atomic force microscopy (AFM) experiments and simulations measuring the work of adhesion (<i>W</i><sub>adh</sub>) between self-mated contacts of ultrathin nominally amorphous and nanocrystalline MoS<sub>2</sub> films deposited on Si scanning probe tips. …”
  13. 20233

    Mean water storage by 0–1 and 0–2 m depths intervals for various successional stages (Yng=  young, Int=  intermediate, DL=  drained lake) within four soil landscapes by M Torre Jorgenson (557154)

    Published 2013
    “…<p><strong>Figure 5.</strong> Mean water storage by 0–1 and 0–2 m depths intervals for various successional stages (Yng=  young, Int=  intermediate, DL=  drained lake) within four soil landscapes. …”
  14. 20234
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  18. 20238

    Data for meta-analysis in this study. by Yi Zhao (14034)

    Published 2024
    “…When the exposure time was more than 60 days, SOD activity did not increase but significantly decreased by 12.1%. However, the POD activity of herbaceous plants increased by 30.4%, 57.3%, 21.9% and 5.81%, respectively, when exposure time of herbaceous plants in elevated O<sub>3</sub> environment was 1–12, 13–30, 31–60 and more than 60 days. …”
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