Algorithm detection steps. by José M. Rivera-Arbeláez (12418512)

Comparison of Multiple Runs of Same Algorithm on the Same Dataset (NSL-KDD). by Muhammad Rehan Naeem (21432852)

Comparison of Multiple Runs of Same Algorithm on the Same Dataset (Kaggle-RL). by Muhammad Rehan Naeem (21432852)

Comparison of Multiple Runs of Same Algorithm on the Same Dataset (UNSW-NB15). by Muhammad Rehan Naeem (21432852)

Structural diagram of the overall SCF-YOLO algorithm. by Yazhou Li (277980)

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Trainable parameters for different algorithms. by Anwar Hossain Efat (19942283)

PR curves of SCF-YOLO detection results. by Yazhou Li (277980)

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Confusion matrix of SCF-YOLO detection results. by Yazhou Li (277980)

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Detection results for short, spur, and spurious-copper defects. by Yazhou Li (277980)

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Detection results for missing hole, mouse bite, and open-circuit defects. by Yazhou Li (277980)

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Algorithm parameter settings employed in the experiments on simulated data. by Liyan Sun (760586)

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The gene network of the epistatic interactions detected for Bipolar Disorder. by Liyan Sun (760586)

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The SNP network of the epistatic interactions detected for Bipolar Disorder. by Liyan Sun (760586)

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Comparison of the semantic features of the C2f module and SCF module; (a) Semantic feature map for C2f Module; (b) Semantic feature map of the SCF module. by Yazhou Li (277980)

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(a): Sample statistical graphs of different types of defects. by Yazhou Li (277980)

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Diagram of 6 common types of PCB defect displays. by Yazhou Li (277980)

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Raw experimental data. by Yazhou Li (277980)

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Recall confidence curve. by Yazhou Li (277980)

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Dataset. by Yazhou Li (277980)

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Train process. by Yazhou Li (277980)

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