Analytical Evaluation of Solder Stress in Electronic Packages Subjected to Random Vibrations

Electronic components, during assembly, transportation, and operation, are exposed to a diverse array of dynamic loads, encompassing high and low frequency vibrations, shock, impact, and most importantly, random vibrations. Such rigorous loading conditions necessitate the design of electronic compon...

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محفوظ في:
التفاصيل البيبلوغرافية
المؤلف الرئيسي: Gharaibeh, Belal (author)
مؤلفون آخرون: Gharaibeh, Mohammad A. (author)
منشور في: 2023
الوصول للمادة أونلاين:http://hdl.handle.net/11675/10959
http://www.scopus.com/inward/record.url?scp=85171673483&partnerID=8YFLogxK
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author Gharaibeh, Belal
author2 Gharaibeh, Mohammad A.
author2_role author
author_facet Gharaibeh, Belal
Gharaibeh, Mohammad A.
author_role author
dc.creator.none.fl_str_mv Gharaibeh, Belal
Gharaibeh, Mohammad A.
dc.date.none.fl_str_mv 2023-08-01
2024-02-05T08:32:43Z
2024-02-05T08:32:43Z
dc.identifier.none.fl_str_mv 10.18280/mmep.100419
http://hdl.handle.net/11675/10959
http://www.scopus.com/inward/record.url?scp=85171673483&partnerID=8YFLogxK
dc.publisher.none.fl_str_mv International Information and Engineering Technology Association
dc.relation.none.fl_str_mv Electrical and Computer Engineering
Mathematical Modelling of Engineering Problems
dc.title.none.fl_str_mv Analytical Evaluation of Solder Stress in Electronic Packages Subjected to Random Vibrations
dc.type.none.fl_str_mv Conference Presentations/Proceedings
info:eu-repo/semantics/publishedVersion
description Electronic components, during assembly, transportation, and operation, are exposed to a diverse array of dynamic loads, encompassing high and low frequency vibrations, shock, impact, and most importantly, random vibrations. Such rigorous loading conditions necessitate the design of electronic components that can endure these harsh circumstances. Analytical methods, owing to their cost-effectiveness, are predominantly employed to investigate the longevity and resilience of these electronic structures, circumventing the need for protracted and costly experiments. In this study, an analytical discussion is presented concerning the random vibration loads applied to printed circuit boards (PCBs) fitted with surface-mounted components. The electronic package is modelled using the multi-layer plate theory, where the board, solder layer, and component are all conceptualized as elastic rectangular plates. The ensuing stress and potential failure of solder joint layers due to the random vibration loading are scrutinized, alongside an examination of how problem parameters, such as the width of the board and the imposed boundary conditions, impact the stress values within the solder joints. The results derived from the analytical solution reveal that solder stresses induced by random vibrations are diminished in shorter joints, enhancing their reliability. The findings of this research corroborate the results obtained from finite element modelling, thereby validating the analytical approach.
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network_acronym_str AUKR
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oai_identifier_str oai:dspace.auk.edu.kw:11675/10959
publishDate 2023
publisher.none.fl_str_mv International Information and Engineering Technology Association
repository.mail.fl_str_mv
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spelling Analytical Evaluation of Solder Stress in Electronic Packages Subjected to Random VibrationsGharaibeh, Belal Gharaibeh, Mohammad A.Electronic components, during assembly, transportation, and operation, are exposed to a diverse array of dynamic loads, encompassing high and low frequency vibrations, shock, impact, and most importantly, random vibrations. Such rigorous loading conditions necessitate the design of electronic components that can endure these harsh circumstances. Analytical methods, owing to their cost-effectiveness, are predominantly employed to investigate the longevity and resilience of these electronic structures, circumventing the need for protracted and costly experiments. In this study, an analytical discussion is presented concerning the random vibration loads applied to printed circuit boards (PCBs) fitted with surface-mounted components. The electronic package is modelled using the multi-layer plate theory, where the board, solder layer, and component are all conceptualized as elastic rectangular plates. The ensuing stress and potential failure of solder joint layers due to the random vibration loading are scrutinized, alongside an examination of how problem parameters, such as the width of the board and the imposed boundary conditions, impact the stress values within the solder joints. The results derived from the analytical solution reveal that solder stresses induced by random vibrations are diminished in shorter joints, enhancing their reliability. The findings of this research corroborate the results obtained from finite element modelling, thereby validating the analytical approach.International Information and Engineering Technology Association2024-02-05T08:32:43Z2024-02-05T08:32:43Z2023-08-01Conference Presentations/Proceedingsinfo:eu-repo/semantics/publishedVersion10.18280/mmep.100419http://hdl.handle.net/11675/10959http://www.scopus.com/inward/record.url?scp=85171673483&partnerID=8YFLogxKElectrical and Computer EngineeringMathematical Modelling of Engineering Problemsoai:dspace.auk.edu.kw:11675/109592025-06-25T08:56:28Z
spellingShingle Analytical Evaluation of Solder Stress in Electronic Packages Subjected to Random Vibrations
Gharaibeh, Belal
status_str publishedVersion
title Analytical Evaluation of Solder Stress in Electronic Packages Subjected to Random Vibrations
title_full Analytical Evaluation of Solder Stress in Electronic Packages Subjected to Random Vibrations
title_fullStr Analytical Evaluation of Solder Stress in Electronic Packages Subjected to Random Vibrations
title_full_unstemmed Analytical Evaluation of Solder Stress in Electronic Packages Subjected to Random Vibrations
title_short Analytical Evaluation of Solder Stress in Electronic Packages Subjected to Random Vibrations
title_sort Analytical Evaluation of Solder Stress in Electronic Packages Subjected to Random Vibrations
url http://hdl.handle.net/11675/10959
http://www.scopus.com/inward/record.url?scp=85171673483&partnerID=8YFLogxK