Evolutionary algorithms for state justification in sequential automatic test pattern generation
Sequential circuit test generation using deterministic, fault-oriented algorithms is highly complex and time consuming. New approaches are needed to enhance the existing techniques, both to reduce execution time and improve fault coverage. Evolutionary algorithms have been effective in solving many...
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| Other Authors: | , , |
| Format: | article |
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2005
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| Online Access: | https://eprints.kfupm.edu.sa/id/eprint/261/1/J_ElMaleh_EISEEC_March2005.pdf |
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