APA (7th ed.) Citation

Osais, Y., El-Maleh, A., & unknown. (2003). A static test compaction technique for combinational circuits based on independent fault clustering.

Chicago Style (17th ed.) Citation

Osais, Y.E, A.H El-Maleh, and unknown. A Static Test Compaction Technique for Combinational Circuits Based on Independent Fault Clustering. 2003.

MLA (9th ed.) Citation

Osais, Y.E, et al. A Static Test Compaction Technique for Combinational Circuits Based on Independent Fault Clustering. 2003.