A Class-based Clustering Static Compaction Technique for Combinational Circuits
Static compaction based on test vector merging is a very simple and efficient technique. However, for a highly incompatible test set, merging achieves little reduction. In this paper, we propose a new static compaction technique in which a test vector is decomposed into its atomic components before...
Saved in:
| Main Author: | |
|---|---|
| Other Authors: | , |
| Format: | article |
| Published: |
2004
|
| Subjects: | |
| Online Access: | https://eprints.kfupm.edu.sa/id/eprint/132/1/A_Class-based_Clustering_Static_Compaction_Technique_for_Combinational_Circuits_.ICM2004.pdf |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|