A Class-based Clustering Static Compaction Technique for Combinational Circuits
Static compaction based on test vector merging is a very simple and efficient technique. However, for a highly incompatible test set, merging achieves little reduction. In this paper, we propose a new static compaction technique in which a test vector is decomposed into its atomic components before...
محفوظ في:
| المؤلف الرئيسي: | El-Maleh, Aiman H. (author) |
|---|---|
| مؤلفون آخرون: | Osais, Yahya E. (author), unknown (author) |
| التنسيق: | article |
| منشور في: |
2004
|
| الموضوعات: | |
| الوصول للمادة أونلاين: | https://eprints.kfupm.edu.sa/id/eprint/132/1/A_Class-based_Clustering_Static_Compaction_Technique_for_Combinational_Circuits_.ICM2004.pdf |
| الوسوم: |
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مواد مشابهة
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A class-based clustering static compaction technique for combinational circuits
حسب: El-Maleh, A.H.
منشور في: (2004) -
Test Vector Decomposition Based Static Compaction Algorithms for Combinational Circuits
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A static test compaction technique for combinational circuits based on independent fault clustering
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Efficient Test Compaction for Combinational Circuits Based on Fault Detection Count-Directed Clustering
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حسب: El-Maleh, Aiman H.
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