Al-Deeb, M. M., & unknown. (1992). A fault independent test generation method for combinational logic circuits.
Chicago Style (17th ed.) CitationAl-Deeb, Mohamed Mahdy, and unknown. A Fault Independent Test Generation Method for Combinational Logic Circuits. 1992.
MLA (9th ed.) CitationAl-Deeb, Mohamed Mahdy, and unknown. A Fault Independent Test Generation Method for Combinational Logic Circuits. 1992.
Warning: These citations may not always be 100% accurate.