Fault characterization and testability considerations in multi-valued logic circuits.

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Main Author: Al-Sharif, Maher Mohammed Mahmoud (author)
Other Authors: unknown (author)
Format: masterThesis
Published: 1998
Subjects:
Online Access:https://eprints.kfupm.edu.sa/id/eprint/10336/1/10336.pdf
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author Al-Sharif, Maher Mohammed Mahmoud
author2 unknown
author2_role author
author_facet Al-Sharif, Maher Mohammed Mahmoud
unknown
author_role author
dc.creator.none.fl_str_mv Al-Sharif, Maher Mohammed Mahmoud
unknown
dc.date.none.fl_str_mv 1998-12
2020
dc.format.none.fl_str_mv application/pdf
dc.identifier.none.fl_str_mv https://eprints.kfupm.edu.sa/id/eprint/10336/1/10336.pdf
(1998) Fault characterization and testability considerations in multi-valued logic circuits. Masters thesis, King Fahd University of Petroleum and Minerals.
dc.language.none.fl_str_mv en
dc.relation.none.fl_str_mv https://eprints.kfupm.edu.sa/id/eprint/10336/
dc.rights.*.fl_str_mv info:eu-repo/semantics/openAccess
dc.subject.none.fl_str_mv Computer
dc.title.none.fl_str_mv Fault characterization and testability considerations in multi-valued logic circuits.
dc.type.none.fl_str_mv Thesis
NonPeerReviewed
info:eu-repo/semantics/publishedVersion
info:eu-repo/semantics/masterThesis
eu_rights_str_mv openAccess
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identifier_str_mv (1998) Fault characterization and testability considerations in multi-valued logic circuits. Masters thesis, King Fahd University of Petroleum and Minerals.
language_invalid_str_mv en
network_acronym_str KFUPM
network_name_str King Fahd University of Petroleum and Minerals
oai_identifier_str oai::10336
publishDate 1998
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spelling Fault characterization and testability considerations in multi-valued logic circuits.Al-Sharif, Maher Mohammed MahmoudunknownComputer1998-122020ThesisNonPeerReviewedinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/masterThesisapplication/pdfhttps://eprints.kfupm.edu.sa/id/eprint/10336/1/10336.pdf (1998) Fault characterization and testability considerations in multi-valued logic circuits. Masters thesis, King Fahd University of Petroleum and Minerals. enhttps://eprints.kfupm.edu.sa/id/eprint/10336/info:eu-repo/semantics/openAccessoai::103362019-11-01T13:59:59Z
spellingShingle Fault characterization and testability considerations in multi-valued logic circuits.
Al-Sharif, Maher Mohammed Mahmoud
Computer
status_str publishedVersion
title Fault characterization and testability considerations in multi-valued logic circuits.
title_full Fault characterization and testability considerations in multi-valued logic circuits.
title_fullStr Fault characterization and testability considerations in multi-valued logic circuits.
title_full_unstemmed Fault characterization and testability considerations in multi-valued logic circuits.
title_short Fault characterization and testability considerations in multi-valued logic circuits.
title_sort Fault characterization and testability considerations in multi-valued logic circuits.
topic Computer
url https://eprints.kfupm.edu.sa/id/eprint/10336/1/10336.pdf