An Evolutionary Meta-Heuristic for State Justification in Sequential Automatic Test Pattern Generation

Sequential circuit test generation using deterministic, fault-oriented algorithms is highly complex and time consuming. New approaches are needed to enhance the existing techniques, both to reduce execution time and improve fault coverage. Evolutionary algorithms have been effective in solving many...

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محفوظ في:
التفاصيل البيبلوغرافية
المؤلف الرئيسي: El-Maleh, Aiman H. (author)
مؤلفون آخرون: Sait, Sadiq M. (author), Shazli, Syed Z. (author), unknown (author)
التنسيق: article
منشور في: 2001
الموضوعات:
الوصول للمادة أونلاين:https://eprints.kfupm.edu.sa/id/eprint/150/1/Sait_EC_April1994_1.pdf
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author El-Maleh, Aiman H.
author2 Sait, Sadiq M.
Shazli, Syed Z.
unknown
author2_role author
author
author
author_facet El-Maleh, Aiman H.
Sait, Sadiq M.
Shazli, Syed Z.
unknown
author_role author
dc.creator.none.fl_str_mv El-Maleh, Aiman H.
Sait, Sadiq M.
Shazli, Syed Z.
unknown
dc.date.none.fl_str_mv 2001
2020
dc.format.none.fl_str_mv application/pdf
dc.identifier.none.fl_str_mv https://eprints.kfupm.edu.sa/id/eprint/150/1/Sait_EC_April1994_1.pdf
(2001) An Evolutionary Meta-Heuristic for State Justification in Sequential Automatic Test Pattern Generation. International Joint INNS-IEEE Conference on Neural Networks (IJCNN). pp. 767-772.
dc.language.none.fl_str_mv en
dc.relation.none.fl_str_mv https://eprints.kfupm.edu.sa/id/eprint/150/
dc.rights.*.fl_str_mv info:eu-repo/semantics/openAccess
dc.subject.none.fl_str_mv Computer
dc.title.none.fl_str_mv An Evolutionary Meta-Heuristic for State Justification in Sequential Automatic Test Pattern Generation
dc.type.none.fl_str_mv Article
PeerReviewed
info:eu-repo/semantics/publishedVersion
info:eu-repo/semantics/article
description Sequential circuit test generation using deterministic, fault-oriented algorithms is highly complex and time consuming. New approaches are needed to enhance the existing techniques, both to reduce execution time and improve fault coverage. Evolutionary algorithms have been effective in solving many search and optimization problems. A common search optimization in sequential ATPG is to justify a desired state assignment on the sequential elements. State justification using deterministic algorithms is a difficult problem and is prone to many backtracks, which can lead to high execution times. In this work, we propose a hybrid approach which uses a combination of evolutionary and deterministic algorithms for state justification. A new method based on Genetic algorithms is proposed, in which we engineer state justification sequences vector by vector. This is in contrast to previous approaches where GA is applied to the whole sequence. The proposed method is compared to previous GA-based approaches. Significant improvements have been obtained for ISCAS benchmark circuits in terms of state coverage and CPU time. Furthermore, it is demonstrated that the state-justification sequence generated, helps the ATPG in detecting a large number hard-to-detect faults.
eu_rights_str_mv openAccess
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identifier_str_mv (2001) An Evolutionary Meta-Heuristic for State Justification in Sequential Automatic Test Pattern Generation. International Joint INNS-IEEE Conference on Neural Networks (IJCNN). pp. 767-772.
language_invalid_str_mv en
network_acronym_str KFUPM
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spelling An Evolutionary Meta-Heuristic for State Justification in Sequential Automatic Test Pattern GenerationEl-Maleh, Aiman H.Sait, Sadiq M.Shazli, Syed Z.unknownComputerSequential circuit test generation using deterministic, fault-oriented algorithms is highly complex and time consuming. New approaches are needed to enhance the existing techniques, both to reduce execution time and improve fault coverage. Evolutionary algorithms have been effective in solving many search and optimization problems. A common search optimization in sequential ATPG is to justify a desired state assignment on the sequential elements. State justification using deterministic algorithms is a difficult problem and is prone to many backtracks, which can lead to high execution times. In this work, we propose a hybrid approach which uses a combination of evolutionary and deterministic algorithms for state justification. A new method based on Genetic algorithms is proposed, in which we engineer state justification sequences vector by vector. This is in contrast to previous approaches where GA is applied to the whole sequence. The proposed method is compared to previous GA-based approaches. Significant improvements have been obtained for ISCAS benchmark circuits in terms of state coverage and CPU time. Furthermore, it is demonstrated that the state-justification sequence generated, helps the ATPG in detecting a large number hard-to-detect faults.20012020ArticlePeerReviewedinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttps://eprints.kfupm.edu.sa/id/eprint/150/1/Sait_EC_April1994_1.pdf (2001) An Evolutionary Meta-Heuristic for State Justification in Sequential Automatic Test Pattern Generation. International Joint INNS-IEEE Conference on Neural Networks (IJCNN). pp. 767-772. enhttps://eprints.kfupm.edu.sa/id/eprint/150/info:eu-repo/semantics/openAccessoai::1502019-11-01T13:22:36Z
spellingShingle An Evolutionary Meta-Heuristic for State Justification in Sequential Automatic Test Pattern Generation
El-Maleh, Aiman H.
Computer
status_str publishedVersion
title An Evolutionary Meta-Heuristic for State Justification in Sequential Automatic Test Pattern Generation
title_full An Evolutionary Meta-Heuristic for State Justification in Sequential Automatic Test Pattern Generation
title_fullStr An Evolutionary Meta-Heuristic for State Justification in Sequential Automatic Test Pattern Generation
title_full_unstemmed An Evolutionary Meta-Heuristic for State Justification in Sequential Automatic Test Pattern Generation
title_short An Evolutionary Meta-Heuristic for State Justification in Sequential Automatic Test Pattern Generation
title_sort An Evolutionary Meta-Heuristic for State Justification in Sequential Automatic Test Pattern Generation
topic Computer
url https://eprints.kfupm.edu.sa/id/eprint/150/1/Sait_EC_April1994_1.pdf