El-Maleh, A., Al-Suwaiyan, A., & unknown. (2002). An efficient test relaxation technique for combinational & full-scan sequential circuits.
Chicago Style (17th ed.) CitationEl-Maleh, A., A. Al-Suwaiyan, and unknown. An Efficient Test Relaxation Technique for Combinational & Full-scan Sequential Circuits. 2002.
MLA (9th ed.) CitationEl-Maleh, A., et al. An Efficient Test Relaxation Technique for Combinational & Full-scan Sequential Circuits. 2002.
Warning: These citations may not always be 100% accurate.