A Retiming-Based Test Pattern Generator Design for Built-In Self Test of Data Path Architectures
Recently, a new Built-In Self Test (BIST) methodology based on balanced bistable sequential kernels has been proposed that reduces the area overhead and performance degradation associated with the conventional BILBO-oriented BIST methodology. This new methodology guarantees high fault coverage but r...
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| Format: | article |
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2001
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| Online Access: | https://eprints.kfupm.edu.sa/id/eprint/138/1/A_Retiming-Based_Test_Pattern_Generator_Design_for_Built-In_Self_Test_iscas2001.pdf |
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