Concurrent BIST Synthesis and Test Scheduling Using Genetic Algorithms
This paper presents an efficient method for concurrent built-in self-test synthesis and test scheduling in high-level synthesis. The method maximizes concurrent testing of modules while performing the allocation of functional units, test registers, and interconnects. The method is based on a genetic...
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| Format: | article |
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2007
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| Online Access: | http://hdl.handle.net/10725/3538 http://dx.doi.org10.1080/1206212X.2007.11441841 http://www.tandfonline.com/doi/abs/10.1080/1206212X.2007.11441841 |
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